Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12333695 | Sample observation system and image processing method | Naoaki KONDO, Minoru Harada | 2025-06-17 |
| 12260545 | Sample observation device and method | Yuki Doi, Naoaki KONDO, Minoru Harada, Hideki Nakayama, Yuji Takagi | 2025-03-25 |
| 12154264 | Defect inspecting system and defect inspecting method | Minoru Harada, Naoaki KONDO | 2024-11-26 |
| 11670528 | Wafer observation apparatus and wafer observation method | Naoaki KONDO, Minoru Harada, Takehiro Hirai | 2023-06-06 |
| 11501950 | Charged particle beam device | Kohei Chiba, Muneyuki Fukuda, Takanori Kishimoto | 2022-11-15 |
| 11177111 | Defect observation device | Akira Ito, Minoru Harada, Takehiro Hirai | 2021-11-16 |
| 10971325 | Defect observation system and defect observation method for semiconductor wafer | Minoru Harada, Yuji Takagi, Naoaki KONDO, Takehiro Hirai | 2021-04-06 |
| 10770260 | Defect observation device | Yuko Otani, Takashi Nobuhara, Nobuhiko KANZAKI, Takehiro Hirai, Miyuki Fukuda +3 more | 2020-09-08 |
| 10593062 | Defect observation apparatus | Yuko Otani, Kazuo Aoki | 2020-03-17 |
| 10436576 | Defect reviewing method and device | Yuko Otani, Yuji Takagi | 2019-10-08 |
| 10297021 | Defect quantification method, defect quantification device, and defect evaluation value display device | Yuji Takagi, Takehiro Hirai | 2019-05-21 |
| 10203851 | Defect classification apparatus and defect classification method | Yuji Takagi, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2019-02-12 |
| 10074511 | Defect image classification apparatus | Takehiro Hirai, Yutaka Tandai | 2018-09-11 |
| 9401015 | Defect classification method, and defect classification system | Yuji Takagi, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2016-07-26 |
| 9342879 | Method and apparatus for reviewing defect | Kenji Nakahira, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2016-05-17 |
| 8892494 | Device for classifying defects and method for adjusting classification | Makoto Ono, Junko Konishi, Takehiro Hirai, Yuya Isomae | 2014-11-18 |
| 8824773 | Defect observation method and defect observation device | Ryo Nakagaki, Kenji Nakahira, Takehiro Hirai, Katsuhiro Kitahashi | 2014-09-02 |