Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8824773 | Defect observation method and defect observation device | Yohei Minekawa, Ryo Nakagaki, Kenji Nakahira, Takehiro Hirai | 2014-09-02 |
| 7181060 | Defect inspection method | Toshifumi Honda, Hirohito Okuda, Yasuhiko Ozawa | 2007-02-20 |
| 6968079 | Investigation device and investigation method | Akira Yoshikawa, Kazuhisa Machida, Hitoshi Komuro, Takehiro Hirai | 2005-11-22 |