Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10889526 | Environmental resistant coating member | Norio Yamaguchi, Taishi Yokoi, Hiroshi Nomura, Satoshi Kitaoka, Takeshi Nakamura +1 more | 2021-01-12 |
| 9859093 | Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatus | Maki Tanaka | 2018-01-02 |
| 9824853 | Electron microscope device and imaging method using same | Mitsutoshi KOBAYASHI, Maki Tanaka | 2017-11-21 |
| 9741530 | Charged-particle-beam device, specimen-image acquisition method, and program recording medium | Yusuke Ominami, Maki Tanaka, Shinsuke Kawanishi | 2017-08-22 |
| 9460889 | Charged particle microscope device and image capturing method | Atsushi Miyamoto | 2016-10-04 |
| 9408591 | Ultrasound diagnostic device and method of generating an intermediary image of ultrasound image | Go Kotaki, Atsushi Miyamoto | 2016-08-09 |
| 9360434 | Optical inspection apparatus and method thereof | Toshifumi Honda | 2016-06-07 |
| 9341584 | Charged-particle microscope device and method for inspecting sample using same | Atsushi Miyamoto | 2016-05-17 |
| 9342879 | Method and apparatus for reviewing defect | Yohei Minekawa, Minoru Harada, Takehiro Hirai, Ryo Nakagaki | 2016-05-17 |
| 9305343 | Observation device and observation method | Atsushi Miyamoto, Takehiro Hirai | 2016-04-05 |
| 9267898 | Optical inspection method and optical inspection apparatus | Toshifumi Honda, Toshihiko Nakata | 2016-02-23 |
| 9245323 | Medical diagnostic device and method of improving image quality of medical diagnostic device | Jie Bai, Atsushi Miyamoto | 2016-01-26 |
| 9019362 | Charged particle beam device and a method of improving image quality of the same | Jie Bai, Atsushi Miyamoto, Chie Shishido, Hideyuki Kazumi | 2015-04-28 |
| 8824773 | Defect observation method and defect observation device | Yohei Minekawa, Ryo Nakagaki, Takehiro Hirai, Katsuhiro Kitahashi | 2014-09-02 |
| 8730318 | Inspection apparatus and method for producing image for inspection | Atsushi Miyamoto, Naoki Hosoya, Minoru Yoshida | 2014-05-20 |
| 8585599 | Ultrasonographic device and method for improving ultrasonographic device image quality | Atsushi Miyamoto | 2013-11-19 |
| 8461527 | Scanning electron microscope and method for processing an image obtained by the scanning electron microscope | Toshifumi Honda, Atsushi Miyamoto | 2013-06-11 |
| 8237119 | Scanning type charged particle beam microscope and an image processing method using the same | Atsushi Miyamoto | 2012-08-07 |
| 8106357 | Scanning electron microscope and method for processing an image obtained by the scanning electron microscope | Toshifumi Honda, Atsushi Miyamoto | 2012-01-31 |
| 7903867 | Method and apparatus for displaying detected defects | Toshifumi Honda | 2011-03-08 |