Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12374520 | Tweezers, conveyance device, and method for conveying sample piece | Naoki SAMURA, Tsunenori Nomaguchi, Yaku Maeda | 2025-07-29 |
| 10157724 | Electron scanning microscope and image generation method | Yusuke Ominami | 2018-12-18 |
| 10141157 | Method for adjusting height of sample and observation system | Makoto Nakabayashi, Yuusuke OOMINAMI | 2018-11-27 |
| 9875877 | Electron scanning microscope and image generation method | Yuusuke OOMINAMI | 2018-01-23 |
| 9824854 | Charged particle beam device, image generation method, observation system | Yusuke Ominami, Junichi Katane, Sukehiro Ito | 2017-11-21 |
| 9741526 | Charged particle beam apparatus and sample image acquiring method | Yusuke Ominami, Masako Nishimura, Hiroyuki Suzuki | 2017-08-22 |
| 9741530 | Charged-particle-beam device, specimen-image acquisition method, and program recording medium | Yusuke Ominami, Kenji Nakahira, Maki Tanaka | 2017-08-22 |
| 9633817 | Diaphragm mounting member and charged particle beam device | Yusuke Ominami, Hiroyuki Suzuki, Masahiko Ajima | 2017-04-25 |
| 9564288 | Sample storage container, charged particle beam apparatus, and image acquiring method | Yusuke Ominami, Hiroyuki Suzuki | 2017-02-07 |
| 9472375 | Charged particle beam device, sample stage unit, and sample observation method | Yusuke Ominami, Mami Konomi, Hiroyuki Suzuki | 2016-10-18 |
| 9466457 | Observation apparatus and optical axis adjustment method | Yusuke Ominami, Mami Konomi, Sukehiro Ito | 2016-10-11 |
| 9373480 | Charged particle beam device and filter member | Yusuke Ominami, Masahiko Ajima, Hiroyuki Suzuki | 2016-06-21 |
| 9362083 | Charged particle beam apparatus and sample observation method | Yusuke Ominami, Hiroyuki Suzuki, Kohtaro Hosoya, Masanari Furiki | 2016-06-07 |
| 9263232 | Charged particle beam device | Yusuke Ominami, Tomohisa Ohtaki, Masahiko Ajima, Sukehiro Ito | 2016-02-16 |
| 9251996 | Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig | Yusuke Ominami, Masahiko Ajima, Hiroyuki Suzuki | 2016-02-02 |
| D748706 | Thin membrane holder for an electron microscope | Yusuke Ominami | 2016-02-02 |
| 9240305 | Charged particle beam device and sample observation method | Yusuke Ominami, Hiroyuki Suzuki, Masahiko Ajima | 2016-01-19 |
| 9236217 | Inspection or observation apparatus and sample inspection or observation method | Yusuke Ominami, Mami Konomi, Sukehiro Ito, Tomohisa Ohtaki | 2016-01-12 |
| D731570 | Thin membrane holder for an electron microscope | Yasuke Ominami, Hiroyuki Suzuki, Masahiko Ajima | 2015-06-09 |
| D730962 | Base of a thin membrane holder for an electron microscope | Yusuke Ominami, Hiroyuki Suzuki, Masahiko Ajima | 2015-06-02 |
| 8969828 | Scanning electron microscope with a table being guided by rolling friction elements | Naoki Sakamoto, Kaname Takahashi, Shigeru Haneda | 2015-03-03 |
| 8933400 | Inspection or observation apparatus and sample inspection or observation method | Yusuke Ominami, Mami Konomi, Sukehiro Ito, Tomohisa Ohtaki | 2015-01-13 |