Issued Patents All Time
Showing 25 most recent of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10431416 | Observation support unit for charged particle microscope and sample observation method using same | Akiko Hisada | 2019-10-01 |
| 10241062 | Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member | Mitsugu Sato, Kenko Uchida, Sadamitsu Aso, Taku Sakazume, Hideo Morishita +2 more | 2019-03-26 |
| 10157724 | Electron scanning microscope and image generation method | Shinsuke Kawanishi | 2018-12-18 |
| 9824854 | Charged particle beam device, image generation method, observation system | Junichi Katane, Shinsuke Kawanishi, Sukehiro Ito | 2017-11-21 |
| 9741526 | Charged particle beam apparatus and sample image acquiring method | Masako Nishimura, Shinsuke Kawanishi, Hiroyuki Suzuki | 2017-08-22 |
| 9741530 | Charged-particle-beam device, specimen-image acquisition method, and program recording medium | Kenji Nakahira, Maki Tanaka, Shinsuke Kawanishi | 2017-08-22 |
| 9673020 | Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample | Tomohisa Ohtaki, Sukehiro Ito | 2017-06-06 |
| 9633817 | Diaphragm mounting member and charged particle beam device | Shinsuke Kawanishi, Hiroyuki Suzuki, Masahiko Ajima | 2017-04-25 |
| 9564288 | Sample storage container, charged particle beam apparatus, and image acquiring method | Shinsuke Kawanishi, Hiroyuki Suzuki | 2017-02-07 |
| 9543111 | Charged particle beam device | Sukehiro Ito, Masami Katsuyama | 2017-01-10 |
| 9508527 | Sample base, charged particle beam device and sample observation method | Takashi Ohshima, Sukehiro Ito | 2016-11-29 |
| 9472375 | Charged particle beam device, sample stage unit, and sample observation method | Mami Konomi, Shinsuke Kawanishi, Hiroyuki Suzuki | 2016-10-18 |
| 9466460 | Charged particle-beam device and specimen observation method | Taku Sakazume, Sukehiro Ito | 2016-10-11 |
| 9466457 | Observation apparatus and optical axis adjustment method | Mami Konomi, Shinsuke Kawanishi, Sukehiro Ito | 2016-10-11 |
| 9418818 | Charged particle beam device and sample observation method | Sukehiro Ito | 2016-08-16 |
| 9373480 | Charged particle beam device and filter member | Shinsuke Kawanishi, Masahiko Ajima, Hiroyuki Suzuki | 2016-06-21 |
| 9362083 | Charged particle beam apparatus and sample observation method | Shinsuke Kawanishi, Hiroyuki Suzuki, Kohtaro Hosoya, Masanari Furiki | 2016-06-07 |
| 9263232 | Charged particle beam device | Shinsuke Kawanishi, Tomohisa Ohtaki, Masahiko Ajima, Sukehiro Ito | 2016-02-16 |
| D748706 | Thin membrane holder for an electron microscope | Shinsuke Kawanishi | 2016-02-02 |
| 9251996 | Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig | Shinsuke Kawanishi, Masahiko Ajima, Hiroyuki Suzuki | 2016-02-02 |
| 9240305 | Charged particle beam device and sample observation method | Hiroyuki Suzuki, Shinsuke Kawanishi, Masahiko Ajima | 2016-01-19 |
| 9236217 | Inspection or observation apparatus and sample inspection or observation method | Mami Konomi, Sukehiro Ito, Tomohisa Ohtaki, Shinsuke Kawanishi | 2016-01-12 |
| 9208995 | Charged particle beam apparatus | Takashi Ohshima, Hiroyuki Ito, Mitsugu Sato, Sukehiro Ito | 2015-12-08 |
| 9165741 | Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample | Tomohisa Ohtaki, Sukehiro Ito | 2015-10-20 |
| 9105442 | Charged particle beam apparatus | Sukehiro Ito, Tomohisa Ohtaki | 2015-08-11 |