Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11977099 | Method for manufacturing semiconductor device | Takayuki Mizuno, Ryo HIRANO, Toru Fujimura, Shigehiko Kato, Yasuhiko Nara +3 more | 2024-05-07 |
| 11709199 | Evaluation apparatus for semiconductor device | Takayuki Mizuno, Ryo HIRANO, Toru Fujimura, Shigehiko Kato, Yasuhiko Nara +3 more | 2023-07-25 |
| 11391756 | Probe module and probe | Ryo HIRANO, Takayuki Mizuno, Toru Fujimura, Shigehiko Kato, Yasuhiko Nara +3 more | 2022-07-19 |
| 9673020 | Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample | Yusuke Ominami, Sukehiro Ito | 2017-06-06 |
| 9263232 | Charged particle beam device | Yusuke Ominami, Shinsuke Kawanishi, Masahiko Ajima, Sukehiro Ito | 2016-02-16 |
| 9236217 | Inspection or observation apparatus and sample inspection or observation method | Yusuke Ominami, Mami Konomi, Sukehiro Ito, Shinsuke Kawanishi | 2016-01-12 |
| 9165741 | Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample | Yusuke Ominami, Sukehiro Ito | 2015-10-20 |
| 9105442 | Charged particle beam apparatus | Yusuke Ominami, Sukehiro Ito | 2015-08-11 |
| 8933400 | Inspection or observation apparatus and sample inspection or observation method | Yusuke Ominami, Mami Konomi, Sukehiro Ito, Shinsuke Kawanishi | 2015-01-13 |
| 8921784 | Scanning electron microscope | Toru Iwaya, Sakae Kobori, Haruhiko Hatano | 2014-12-30 |
| 8921786 | Charged particle beam apparatus | Yusuke Ominami, Sukehiro Ito | 2014-12-30 |
| 8809782 | Scanning electron microscope | Masahiko Ajima, Sukehiro Ito, Mitsuru Onuma, Akira Omachi | 2014-08-19 |
| 8710439 | Charged particle beam apparatus | Yusuke Ominami, Sukehiro Ito | 2014-04-29 |
| D635168 | Portion of an electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2011-03-29 |
| D635167 | Portion of an electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2011-03-29 |
| D633537 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2011-03-01 |
| D633538 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2011-03-01 |
| D632323 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2011-02-08 |
| D626579 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2010-11-02 |
| D625749 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2010-10-19 |
| D623211 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Masahiko Ajima | 2010-09-07 |
| 7365323 | Environmental scanning electron microcope | Kenichi Hirane, Ryoichi Ishii, Haruhisa Takahata | 2008-04-29 |