Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11977099 | Method for manufacturing semiconductor device | Tomohisa Ohtaki, Takayuki Mizuno, Ryo HIRANO, Toru Fujimura, Shigehiko Kato +3 more | 2024-05-07 |
| 11709199 | Evaluation apparatus for semiconductor device | Tomohisa Ohtaki, Takayuki Mizuno, Ryo HIRANO, Toru Fujimura, Shigehiko Kato +3 more | 2023-07-25 |
| 11391756 | Probe module and probe | Ryo HIRANO, Takayuki Mizuno, Tomohisa Ohtaki, Toru Fujimura, Shigehiko Kato +3 more | 2022-07-19 |
| 10782340 | Dynamic response analysis prober device | Masaaki Komori, Katsuo Oki, Takayuki Mizuno | 2020-09-22 |
| 10712384 | Circuit inspection method and sample inspection apparatus | Akira Kageyama | 2020-07-14 |
| 8816712 | Inspection device | Mitsuhiro Nakamura, Hiroshi Toyama, Katsuo Oki, Tomoharu Obuki, Masahiro Sasajima | 2014-08-26 |
| 8754664 | Inspection method and device | Tohru Ando | 2014-06-17 |
| 8178837 | Logical CAD navigation for device characteristics evaluation system | Tohru Ando, Tsutomu Saito, Mikio Takagi, Koichi Takauchi | 2012-05-15 |
| 8178840 | Specimen inspection equipment and how to make the electron beam absorbed current images | Tomoharu Obuki, Hiroshi Toyama, Yasuhiro Mitsui, Munetoshi Fukui, Tohru Ando +3 more | 2012-05-15 |
| 8067752 | Semiconductor testing method and semiconductor tester | Tohru Ando, Tsutomu Saito, Shinichi Kato, Takeshi Sunaoshi | 2011-11-29 |
| 7989766 | Sample inspection apparatus | Tohru Ando, Masahiro Sasajima, Tsutomu Saito, Tomoharu Obuki, Isamu Sekihara | 2011-08-02 |
| 7957579 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2011-06-07 |
| D637098 | Semiconductor testing machine | Mitsuru Oonuma, Akira Omachi, Kazuhiko Nishiyama, Hiroyuki Suzuki | 2011-05-03 |
| 7894658 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2011-02-22 |
| 7875156 | Probe storage container, prober apparatus, probe arranging method and manufacturing method of probe storage container | Masanori Gunji, Katsunori Nakajima, Tsutomu Saito, Shigeru Izawa | 2011-01-25 |
| 7855363 | Inspection method and apparatus using an electron beam | Hiroshi Miyai, Ryuichi Funatsu, Taku Ninomiya | 2010-12-21 |
| 7732791 | Semiconductor testing method and semiconductor tester | Tohru Ando, Tsutomu Saito, Shinichi Kato, Takeshi Sunaoshi | 2010-06-08 |
| 7700916 | Logical CAD navigation for device characteristics evaluation system | Tohru Ando, Tsutomu Saito, Mikio Takagi, Koichi Takauchi | 2010-04-20 |
| 7663104 | Specimen inspection equipment and how to make electron beam absorbed current images | Tomoharu Obuki, Hiroshi Toyama, Yasuhiro Mitsui, Munetoshi Fukui, Tohru Ando +3 more | 2010-02-16 |
| 7532328 | Circuit-pattern inspection apparatus | Masaaki Nojiri, Kouichi Hayakawa, Takashi Hiroi | 2009-05-12 |
| 7457453 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2008-11-25 |
| 7425704 | Inspection method and apparatus using an electron beam | Hiroshi Miyai, Ryuichi Funatsu, Taku Ninomiya | 2008-09-16 |
| 7292327 | Circuit-pattern inspection apparatus | Masaaki Nojiri, Kouichi Hayakawa, Takashi Hiroi | 2007-11-06 |
| 7269280 | Method and its apparatus for inspecting a pattern | Takashi Hiroi, Masahiro Watanabe, Maki Tanaka, Asahiro Kuni, Chie Shishido +2 more | 2007-09-11 |
| 7266235 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2007-09-04 |