Issued Patents All Time
Showing 1–25 of 55 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10192653 | Twisted string-shaped electric cable for underwater purpose | Dai Fujikawa | 2019-01-29 |
| 9894549 | Information processing apparatus, radio communication system, and terminal position estimation method | — | 2018-02-13 |
| 8643707 | Image signal processing apparatus, image signal processing method, recording medium, and integrated circuit | Keizo Matsumoto, Katsuo Saigo, Masanobu Inoe, Seiji Nakazawa | 2014-02-04 |
| 8599107 | Image system, display device and eyeglasses device used in the same | Kazuhiro Mihara, Katsuo Saigo, Masafumi Shimotashiro, Seiji Nakazawa, Masayuki Kozuka +1 more | 2013-12-03 |
| 8564648 | Image signal processing apparatus, image signal processing method, recording medium, and integrated circuit | Keizo Matsumoto, Katsuo Saigo, Masanobu Inoe, Seiji Nakazawa | 2013-10-22 |
| 8542246 | Color conversion device, color conversion table and color conversion method | Katsuo Saigo, Hisakazu Hitomi, Masanobu Inoe, Masahiro Kawashima, Akihiro Takeuchi | 2013-09-24 |
| 8421008 | Pattern check device and pattern check method | Mari Nozoe, Mitsuru Okamura, Makoto Suzuki, Yusuke Ominami | 2013-04-16 |
| 8421010 | Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample | Takashi Hiroi, Yasuhiro Gunji, Masaaki Nojiri | 2013-04-16 |
| 8294752 | Image system, image display device and image viewing eyeglasses with them | Kazuhiro Mihara, Katsuo Saigo, Masafumi Shimotashiro, Seiji Nakazawa, Masayuki Kozuka +1 more | 2012-10-23 |
| 8086021 | Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope | Yusuke Ominami, Yasuhiro Gunji | 2011-12-27 |
| 8086022 | Electron beam inspection system and an image generation method for an electron beam inspection system | Yusuke Ominami, Yasuhiro Gunji | 2011-12-27 |
| 8036447 | Inspection apparatus for inspecting patterns of a substrate | Koichi Hayakawa, Masaaki Nojiri, Michio Nakano, Takako Fujisawa, Dai Fujii | 2011-10-11 |
| 7999565 | Inspection apparatus and inspection method using electron beam | Yasuhiro Gunji, Shigeya Tanaka | 2011-08-16 |
| 7995833 | Method of alignment for efficient defect review | Takehiko Konno | 2011-08-09 |
| 7957579 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2011-06-07 |
| 7894658 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2011-02-22 |
| 7872219 | Illumination device with plural color light sources and first and second integrators | Yusaku Shimaoka, Atsushi Hatakeyama, Yoshimasa Fushimi | 2011-01-18 |
| 7855363 | Inspection method and apparatus using an electron beam | Ryuichi Funatsu, Taku Ninomiya, Yasuhiko Nara | 2010-12-21 |
| 7847805 | Display apparatus, display method, program and recording medium | Masakazu Ogasawara, Akira Ueda | 2010-12-07 |
| 7607784 | Light emission method, light emitting apparatus and projection display apparatus | Yusaku Shimaoka, Takaaki Gyoten | 2009-10-27 |
| 7518383 | Inspection apparatus and inspection method using electron beam | Yasuhiro Gunji, Shigeya Tanaka | 2009-04-14 |
| 7457453 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2008-11-25 |
| 7425704 | Inspection method and apparatus using an electron beam | Ryuichi Funatsu, Taku Ninomiya, Yasuhiko Nara | 2008-09-16 |
| 7294833 | Method of alignment for efficient defect review | Takehiko Konno | 2007-11-13 |
| 7269280 | Method and its apparatus for inspecting a pattern | Takashi Hiroi, Masahiro Watanabe, Maki Tanaka, Asahiro Kuni, Chie Shishido +2 more | 2007-09-11 |