Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9188554 | Pattern inspection device and pattern inspection method | Chie Shishido, Shinya Murakami, Takashi Hiroi, Taku Ninomiya | 2015-11-17 |
| 8036447 | Inspection apparatus for inspecting patterns of a substrate | Koichi Hayakawa, Hiroshi Miyai, Masaaki Nojiri, Takako Fujisawa, Dai Fujii | 2011-10-11 |
| 7889911 | Image processing unit for wafer inspection tool | Shigeya Tanaka, Yoshiyuki Momiyama, Takashi Hiroi, Kazuya Hayashi, Dai Fujii +3 more | 2011-02-15 |
| 7421110 | Image processing unit for wafer inspection tool | Shigeya Tanaka, Yoshiyuki Momiyama, Takashi Hiroi, Kazuya Hayashi, Dai Fujii +3 more | 2008-09-02 |
| 5273810 | Polybutylene terephthalate molding composition and molded thin-walled articles therefrom | Osamu Kanoto, Kazuya Goshima, Nobuyuki Matsunaga | 1993-12-28 |
| 5043371 | Flame-retardant polybutylene terephthalate resin composition and molded article for electrical component | Hirouki Amono, Hiroshi Nakatsuji | 1991-08-27 |