Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7889911 | Image processing unit for wafer inspection tool | Michio Nakano, Shigeya Tanaka, Takashi Hiroi, Kazuya Hayashi, Dai Fujii +3 more | 2011-02-15 |
| 7421110 | Image processing unit for wafer inspection tool | Michio Nakano, Shigeya Tanaka, Takashi Hiroi, Kazuya Hayashi, Dai Fujii +3 more | 2008-09-02 |