Issued Patents All Time
Showing 26–50 of 55 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7266235 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2007-09-04 |
| 7133550 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2006-11-07 |
| 7116816 | Method of inspecting a pattern and an apparatus thereof and a method of processing a specimen | Maki Tanaka, Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Hiroshi Morioka +2 more | 2006-10-03 |
| 7116817 | Method and apparatus for inspecting a semiconductor device | Maki Tanaka, Masahiro Watanabe, Kenji Watanabe, Mari Nozoe | 2006-10-03 |
| 7071468 | Circuit pattern inspection method and its apparatus | Ryuichi Funatsu, Taku Ninomiya, Yasuhiko Nara | 2006-07-04 |
| 7049587 | Apparatus for inspecting a specimen | Takashi Hiroi, Masahiro Watanabe, Asahiro Kuni, Maki Tanaka, Munenori Fukunishi +2 more | 2006-05-23 |
| 7034298 | Inspection method and apparatus using an electron beam | Ryuichi Funatsu, Taku Ninomiya, Yasuhiko Nara | 2006-04-25 |
| 6975754 | Circuit pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Asahiro Kuni, Maki Tanaka +2 more | 2005-12-13 |
| 6952492 | Method and apparatus for inspecting a semiconductor device | Maki Tanaka, Masahiro Watanabe, Kenji Watanabe, Mari Nozoe | 2005-10-04 |
| 6943752 | Presentation system, a display device, and a program | Junji Masumoto, Shigekazu Yamagishi | 2005-09-13 |
| 6898305 | Circuit pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Asahiro Kuni, Maki Tanaka +2 more | 2005-05-24 |
| 6865288 | Pattern inspection method and apparatus | Chie Shishido, Masahiro Watanabe, Yuji Takagi | 2005-03-08 |
| 6771419 | Rear projection type image display unit | Shigekazu Yamagishi, Hiroshi Yamaguchi, Kenichi Ikeda | 2004-08-03 |
| 6703850 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Aritoshi Sugimoto +2 more | 2004-03-09 |
| 6628248 | Image display apparatus and method for compensating display image of image display apparatus | Junji Masumoto, Shigekazu Yamagishi, Hitoshi Noda, Atsushi Hatakeyama | 2003-09-30 |
| 6613593 | Method of fabricating a semiconductor device | Maki Tanaka, Masahiro Watanabe, Kenji Watanabe, Mari Nozoe | 2003-09-02 |
| 6583634 | Method of inspecting circuit pattern and inspecting instrument | Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Aritoshi Sugimoto +2 more | 2003-06-24 |
| 6570611 | Image display | Hiroaki Satou, Tetsuro Shiota | 2003-05-27 |
| 6511184 | Color image display apparatus | Shigekazu Yamagishi, Hitoshi Noda, Atsushi Hatakeyama | 2003-01-28 |
| 6465781 | Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatus | Norimasa Nishimura, Akira Shimase, Masahiro Watanabe, Asahiro Kuni, Taku Ninomiya | 2002-10-15 |
| 6333962 | Non-destructive inspection apparatus and inspection system using it | Hiroshi Kitaguchi, Shigeru Izumi, Katsutoshi Sato, Yasuko Aoki, Yukiya Hattori | 2001-12-25 |
| 6288756 | Luminance correction circuit and video display monitor thereof | Tetsuro Shiota | 2001-09-11 |
| 6049586 | Non-destructive inspection apparatus and inspection system using it | Hiroshi Kitaguchi, Shigeru Izumi, Katsutoshi Sato, Yasuko Aoki, Yukiya Hattori | 2000-04-11 |
| 5990853 | Projection type image displaying apparatus | Yasunori Kuratomi, Akio Takimoto, Koji Akiyama, Hiroshi Tsutsui, Toshikatsu Kawakami +1 more | 1999-11-23 |
| 5933473 | Non-destructive inspection apparatus and inspection system using it | Hiroshi Kitaguchi, Shigeru Izumi, Katsutoshi Sato, Yasuko Aoki, Yukiya Hattori | 1999-08-03 |