Issued Patents All Time
Showing 1–25 of 196 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12431011 | Traffic safety support system and learning method executable by the same | Akihito Kimata, Hirokazu Tokushima, Shigeru Inoue, Yoshitaka Mimura, Yoji Sasabuchi | 2025-09-30 |
| 12415533 | Traffic safety support system | Akihito Kimata, Shigeru Inoue, Yoshitaka Mimura, Hideo KADOWAKI, Takahiro KUREHASHI +1 more | 2025-09-16 |
| 12374223 | Traffic safety support system | Akihito Kimata, Shigeru Inoue, Yoshitaka Mimura, Takahiro KUREHASHI, Hideo KADOWAKI +1 more | 2025-07-29 |
| 12333945 | Traffic safety support system | Hideo KADOWAKI, Akihito Kimata, Shigeru Inoue, Yoshitaka Mimura, Masaki OKUMOTO +1 more | 2025-06-17 |
| 12330674 | Traffic safety support system | Hideo KADOWAKI, Shigeru Inoue, Yoshitaka Mimura, Masaki OKUMOTO, Akihito Kimata +1 more | 2025-06-17 |
| 12260545 | Sample observation device and method | Yuki Doi, Naoaki KONDO, Minoru Harada, Hideki Nakayama, Yohei Minekawa | 2025-03-25 |
| 12243711 | Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatus | Takahiro Nishihata, Takuma Yamamoto, Yasunori Goto, Yasutaka Toyoda | 2025-03-04 |
| 12230119 | Control device, control method, and recording medium | Eiji Takada, Hironori NAKATA, Hiroki NAOSHIMA, Yuri MASHIMO | 2025-02-18 |
| 12142457 | Charged particle beam device | Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Makoto Suzuki | 2024-11-12 |
| 12087165 | Moving body prediction device, traffic safety support system, and storage medium | Akihito Kimata, Tim Puphal, Ryohei Hirano, Masaki OKUMOTO | 2024-09-10 |
| 11802841 | Defect detection device, defect detection method, and defect observation device | Yuko Otani | 2023-10-31 |
| 11195416 | System, management method, and information processing device for determination of parking position of vehicle | — | 2021-12-07 |
| 11170483 | Sample observation device and sample observation method | Minoru Harada, Naoaki KONDO, Takehiro Hirai | 2021-11-09 |
| 11087454 | Defect observation device and defect observation method | Naoaki KONDO, Minoru Harada, Takehiro Hirai | 2021-08-10 |
| 10996569 | Measurement device, method and display device | Fumihiko Fukunaga, Yasunori Goto | 2021-05-04 |
| 10977786 | Wafer observation device | Naoaki KONDO, Minoru Harada, Takehiro Hirai | 2021-04-13 |
| 10971325 | Defect observation system and defect observation method for semiconductor wafer | Minoru Harada, Naoaki KONDO, Takehiro Hirai, Yohei Minekawa | 2021-04-06 |
| 10810733 | Defect classification apparatus and defect classification method | Naoaki KONDO, Takehiro Hirai, Minoru Harada | 2020-10-20 |
| 10783625 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Minoru Harada, Ryo Nakagaki, Fumihiko Fukunaga | 2020-09-22 |
| 10770260 | Defect observation device | Yuko Otani, Yohei Minekawa, Takashi Nobuhara, Nobuhiko KANZAKI, Takehiro Hirai +3 more | 2020-09-08 |
| 10720307 | Electron microscope device and inclined hole measurement method using same | Fumihiko Fukunaga, Yasunori Goto | 2020-07-21 |
| 10559074 | Sample observation device and sample observation method | Minoru Harada, Naoaki KONDO, Takehiro Hirai | 2020-02-11 |
| 10521297 | Optical disc apparatus and optical disc in which user data is recorded in a first space in units of a first length and management information is recorded in a second space in units of a second length different from the first length | Kohei Nakata | 2019-12-31 |
| 10436576 | Defect reviewing method and device | Yohei Minekawa, Yuko Otani | 2019-10-08 |
| 10297021 | Defect quantification method, defect quantification device, and defect evaluation value display device | Yohei Minekawa, Takehiro Hirai | 2019-05-21 |