Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12243711 | Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatus | Yuji Takagi, Takuma Yamamoto, Yasunori Goto, Yasutaka Toyoda | 2025-03-04 |
| 12142457 | Charged particle beam device | Mayuka Osaki, Yuji Takagi, Takuma Yamamoto, Makoto Suzuki | 2024-11-12 |
| 11545336 | Scanning electron microscopy system and pattern depth measurement method | Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida | 2023-01-03 |
| 11355304 | Electronic microscope device | Mayuka Osaki, Wei Sun, Takuma Yamamoto | 2022-06-07 |
| 11302513 | Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatus | Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida, Chihiro Ida | 2022-04-12 |