Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12424407 | Inspection device and inspection method | — | 2025-09-23 |
| 11715189 | Semiconductor image processing apparatus | Atsushi Nakajima, Youyang Ng, Yuko Kono, Takuji OHASHI | 2023-08-01 |
| 11302513 | Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatus | Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida | 2022-04-12 |
| 10854419 | Contour extraction method, contour extraction device, and non-volatile recording medium | Yukinobu Sakata | 2020-12-01 |