Issued Patents All Time
Showing 1–25 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423962 | System for generating image, and non-transitory computer-readable medium | Masayoshi Ishikawa, Masanori OUCHI | 2025-09-23 |
| 12423941 | Image recognition system | Toshinori Yamauchi, Masayoshi Ishikawa, Takefumi KAKINUMA, Masaki Hasegawa, Kentaro OHIRA | 2025-09-23 |
| 12400383 | Training method for learning apparatus, and image generation system | Zhaohui Cheng, Hideto Dohi, Hiroya Ohta, Hideyuki Kazumi | 2025-08-26 |
| 12394038 | Image processing program, image processing device, and image processing method | Masanori OUCHI, Shinichi Shinoda, Ryou YUMIBA, Hiroyuki Shindo | 2025-08-19 |
| 12243711 | Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatus | Takahiro Nishihata, Yuji Takagi, Takuma Yamamoto, Yasunori Goto | 2025-03-04 |
| 12100133 | Image evaluation apparatus and image evaluation method | Shuyang DOU, Fumihiro Bekku, Takefumi KAKINUMA, Shinichi Shinoda | 2024-09-24 |
| 12014530 | Image recognition device and method | Ryou YUMIBA, Hiroyuki Shindo | 2024-06-18 |
| 11836906 | Image processing system and computer program for performing image processing | Shinichi Shinoda, Shigetoshi Sakimura, Masayoshi Ishikawa, Hiroyuki Shindo, Hitoshi Sugahara | 2023-12-05 |
| 11600536 | Dimension measurement apparatus, dimension measurement program, and semiconductor manufacturing system | Yutaka Okuyama, Takeshi Ohmori | 2023-03-07 |
| 11587225 | Pattern inspection system | Shuyang DOU, Shinichi Shinoda, Hiroyuki Shindo | 2023-02-21 |
| 11176405 | Image processing system and computer program for performing image processing | Shinichi Shinoda, Shigetoshi Sakimura, Masayoshi Ishikawa, Hiroyuki Shindo, Hitoshi Sugahara | 2021-11-16 |
| 11132788 | Pattern inspection system | Shuyang DOU, Shinichi Shinoda, Hiroyuki Shindo | 2021-09-28 |
| 11049351 | Money handling machine and money handling system | — | 2021-06-29 |
| 10937146 | Image evaluation method and image evaluation device | Shinichi Shinoda, Masayoshi Ishikawa, Yuichi Abe, Hiroyuki Shindo | 2021-03-02 |
| 10643326 | Semiconductor measurement apparatus and computer program | Ryoichi Matsuoka | 2020-05-05 |
| 10558127 | Exposure condition evaluation device | Shinichi Shinoda, Hiroyuki Ushiba, Hitoshi Sugahara | 2020-02-11 |
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo, Daisuke Hibino +1 more | 2019-10-15 |
| 10317203 | Dimension measuring apparatus and computer readable medium | Tsuyoshi Minakawa | 2019-06-11 |
| 10190875 | Pattern measurement condition setting device and pattern measuring device | Shinichi Shinoda, Hiroyuki Ushiba, Hitoshi Sugahara | 2019-01-29 |
| 10180317 | Pattern-measuring device and computer program | Hiroyuki Sindo | 2019-01-15 |
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo, Daisuke Hibino +1 more | 2018-06-05 |
| 9858659 | Pattern inspecting and measuring device and program | Tsuyoshi Minakawa, Takashi Hiroi, Takeyuki Yoshida, Taku Ninomiya, Takuma Yamamoto +3 more | 2018-01-02 |
| 9846931 | Pattern sensing device and semiconductor sensing system | Hiroyuki Shindo, Yoshihiro Ota | 2017-12-19 |
| 9830705 | Image evaluation apparatus and pattern shape evaluation apparatus | Shinichi Shinoda, Tsuyoshi Minakawa, Ryoichi Matsuoka | 2017-11-28 |
| 9495844 | Money handling machine, money handling system and money handling method | Masaki Inoue | 2016-11-15 |