MH

Masaki Hasegawa

PA Panasonic: 22 patents #856 of 21,108Top 5%
HH Hitachi High-Technologies: 18 patents #211 of 1,917Top 15%
Sumitomo Electric Industries: 16 patents #1,466 of 21,551Top 7%
IBM: 16 patents #6,952 of 70,183Top 10%
HI Hitachi: 9 patents #4,653 of 28,497Top 20%
DI Daicel Chemical Industries: 3 patents #213 of 893Top 25%
TL Toyota Central R&D Labs: 3 patents #379 of 1,657Top 25%
Merck: 2 patents #3,919 of 9,382Top 45%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
SC Sanyo Electric Co.: 1 patents #3,644 of 6,347Top 60%
MI Mitsui Toatsu Chemicals, Incorporated: 1 patents #880 of 1,543Top 60%
Overall (All Time): #16,037 of 4,157,543Top 1%
95
Patents All Time

Issued Patents All Time

Showing 1–25 of 95 patents

Patent #TitleCo-InventorsDate
12423941 Image recognition system Toshinori Yamauchi, Masayoshi Ishikawa, Takefumi KAKINUMA, Kentaro OHIRA, Yasutaka Toyoda 2025-09-23
12300819 Negative electrode for secondary battery, and non-aqueous electrolyte secondary battery Masahiro Soga, Takahiro Fukuoka 2025-05-13
12148917 Nonaqueous electrolyte secondary battery negative electrode and nonaqueous electrolyte secondary battery Takahiro Fukuoka, Masahiro Soga, Yuto Horiuchi, Takashi Yamamoto 2024-11-19
11515121 Electron beam device Tomohiko Ogata, Hisaya Murakoshi, Noriyuki Kaneoka, Katsunori Onuki 2022-11-29
11342211 Wafer inspection apparatus and wafer inspection method Akira Doi, Minoru Sasaki, Hironori Ogawa, Tomohiko Ogata, Yuko Okada 2022-05-24
11193895 Semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection device Kentaro OHIRA, Tomohiko Ogata, Katsunori Onuki, Noriyuki Kaneoka 2021-12-07
11107655 Charged particle beam device Tomohiko Ogata, Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi 2021-08-31
11059986 Composition comprising a nanosized light emitting material Noriyuki MATSUDA 2021-07-13
11002687 Defect inspection method and defect inspection device Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi, Tomohiko Ogata 2021-05-11
10991981 Nonaqueous electrolyte secondary battery Yuanlong Zhong 2021-04-27
10923315 Charged particle beam apparatus, and method of adjusting charged particle beam apparatus Tomohiko Ogata, Noriyuki Kaneoka, Hisaya Murakoshi, Katsunori Onuki 2021-02-16
10879015 Viologen compound, method for producing the same, negative electrode active material, and electricity storage device Hitoshi Kumagai, Yuka Makino, Nobuhiro OGIHARA 2020-12-29
10566625 Electrode active material, electrode for electricity storage device, electricity storage device, and method for producing electrode active material Nobuhiro OGIHARA 2020-02-18
10522320 Charged particle beam device and method for adjusting charged particle beam device Tomohiko Ogata, Hisaya Murakoshi, Katsunori Onuki, Noriyuki Kaneoka 2019-12-31
10418187 Carbon porous body, method for producing the same, electrode for storage device, and storage device Nobuhiro OGIHARA, Norihiko Setoyama 2019-09-17
10304657 Mirror ion microscope and ion beam control method Hiroyasu Shichi, Teruo Kohashi, Shinichi Matsubara 2019-05-28
10126475 Polarized light emissive device 2018-11-13
10103382 Nonaqueous electrolyte secondary battery Natsumi Goto, Takashi Takeuchi 2018-10-16
9799925 Nonaqueous electrolyte secondary battery Takayuki Shirane 2017-10-24
9460891 Inspection equipment 2016-10-04
9287562 Negative electrode active material comprising spinel lithium titanate, electrical storage device, and method for producing negative electrode active material Takashi Takeuchi, Natsumi Goto 2016-03-15
9065148 Negative electrode active material for lithium ion secondary battery and method for producing the same Natsumi Goto, Takashi Takeuchi 2015-06-23
8962187 Negative electrode active material for lithium ion secondary battery and method for producing the same Natsumi Goto, Takashi Takeuchi 2015-02-24
8920976 Nonaqueous electrolyte secondary battery Natsumi Goto, Takashi Takeuchi 2014-12-30
8766185 Charged particle beam device Tomokazu Shimakura 2014-07-01