Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400827 | Charged particle beam device | Hideo Morishita, Tatsuro Ide, Junichi Katane | 2025-08-26 |
| 11961699 | Charged particle beam device | Hideo Morishita, Hiroyuki Yamamoto, Junichi Katane | 2024-04-16 |
| 11756763 | Scanning electron microscope | Hideo Morishita, Junichi Katane | 2023-09-12 |
| 11587226 | Magnetic domain image processing apparatus and magnetic domain image processing method | Ryoko Araki | 2023-02-21 |
| 11170972 | Scanning electron microscope and method for analyzing secondary electron spin polarization | Hideo Morishita, Junichi Katane | 2021-11-09 |
| 11163974 | Image acquisition system and image acquisition method | Ryoko Araki, Jun Xie | 2021-11-02 |
| 11139143 | Spin polarimeter | Hideo Morishita, Toshihide Agemura | 2021-10-05 |
| 10395885 | Charged particle device, charged particle irradiation method, and analysis device | — | 2019-08-27 |
| 10304657 | Mirror ion microscope and ion beam control method | Hiroyasu Shichi, Masaki Hasegawa, Shinichi Matsubara | 2019-05-28 |
| 10210962 | Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating | Ken Harada, Tomohiro Iwane | 2019-02-19 |
| 9864114 | Zone plate having annular or spiral shape and Y-shaped branching edge dislocation | Ken Harada | 2018-01-09 |
| 8022364 | Electron spin detector, and spin polarized scanning electron microscope and spin-resolved x-ray photoelectron spectroscope using the electron spin detector | — | 2011-09-20 |
| 7985952 | Charged particle spin polarimeter, microscope, and photoelectron spectroscope | — | 2011-07-26 |
| 7755046 | Transmission electron microscope | Takashi Ohshima, Takao Matsumoto, Hirokazu Nishida | 2010-07-13 |