Issued Patents All Time
Showing 25 most recent of 34 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11677092 | Assembly method using assembly tool | Yo Shimomura, Naoki Ishihara | 2023-06-13 |
| 11597896 | Cleaning liquid, cleaning method, and method for producing semiconductor wafer | Toshiaki Shibata, Yasuhiro Kawase, Atsushi Ito, Tomohiro Kusano, Yutaro Takeshita | 2023-03-07 |
| 11551907 | Electron microscope and sample observation method using the same | Keiko Shimada, Shigeo Mori, Atsuhiro Kotani | 2023-01-10 |
| 11545712 | Shape correction device for frame body, and method for manufacturing electrolyte film/electrode structure provided with resin frame for fuel cell | Satoshi Hasegawa, Sachio Suzuki, Kouya Shimada, Nobuyoshi Muromoto, Hiroshi Yoshioka | 2023-01-03 |
| 11149231 | Cleaning liquid, cleaning method, and method for producing semiconductor wafer | Yutaro Takeshita, Toshiaki Shibata, Kan TAKESHITA | 2021-10-19 |
| 11066627 | Cleaning agent composition for semiconductor device substrate, method of cleaning semiconductor device substrate, method of manufacturing semiconductor device substrate, and semiconductor device substrate | Tomohiro Kusano, Yasuhiro Kawase | 2021-07-20 |
| 11024482 | Holography reconstruction method and program | Kodai Niitsu, Keiko Shimada | 2021-06-01 |
| 11011344 | Interferometric electron microscope | Toshiaki Tanigaki, Tetsuya Akashi | 2021-05-18 |
| 10948426 | Particle beam device, observation method, and diffraction grating | Keiko Shimada, Kodai Niitsu | 2021-03-16 |
| 10770264 | Interference optical system unit, charged particle beam interference apparatus, and method for observing charged particle beam interference image | Yoh Iwasaki, Keiko Shimada | 2020-09-08 |
| 10535497 | Electron microscope and imaging method | Hirokazu Tamaki, Keiji Tamura, Yoshifumi Taniguchi, Hiroto Kasai, Toshie Yaguchi +1 more | 2020-01-14 |
| 10210962 | Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating | Teruo Kohashi, Tomohiro Iwane | 2019-02-19 |
| 10113141 | Cleaning liquid for semiconductor device and method for cleaning substrate for semiconductor device | Atsushi Ito, Toshiyuki Suzuki | 2018-10-30 |
| 9864114 | Zone plate having annular or spiral shape and Y-shaped branching edge dislocation | Teruo Kohashi | 2018-01-09 |
| 9679738 | Electron microscope | Hiroaki Matsumoto, Takeshi Sato, Yoshifumi Taniguchi | 2017-06-13 |
| 9365802 | Cleaning liquid for semiconductor device substrates and method of cleaning substrate for semiconductor devices | Atsushi Ito, Toshiyuki Suzuki | 2016-06-14 |
| 8946628 | Electron beam interference device and electron beam interferometry | Hiroto Kasai | 2015-02-03 |
| 8785851 | Interference electron microscope | Toshiaki Tanigaki, Shinji Aizawa, Tsuyoshi Matsuda, Yoshio Takahashi | 2014-07-22 |
| 8772715 | Electron beam device including a first electron biprism to split an electron beam into two beams and a second electron biprism in the image forming lens system to superpose the two beams | Toshiaki Tanigaki, Shinji Aizawa, Tsuyoshi Matsuda, Yoshio Takahashi | 2014-07-08 |
| 8653472 | Electromagnetic field application system | Akira Sugawara, Noboru Moriya | 2014-02-18 |
| 8193494 | Transmission electron microscope and method for observing specimen image with the same | Akira Sugawara | 2012-06-05 |
| 7999652 | Thick film resistor | Minoru Sakamaki, Isao Matsui | 2011-08-16 |
| 7939801 | Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method | Hiroto Kasai | 2011-05-10 |
| 7923685 | Electron beam device | Hiroto Kasai | 2011-04-12 |
| 7872755 | Interferometer | Tetsuya Akashi, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya | 2011-01-18 |