Ken Harada — 34 Patents at Riken

Ken Harada has been granted 34 US patents while listed as an inventor at Riken. The first was granted in 2000 and the most recent in June 2023. Ken Harada ranks #100,737 of 4,157,543 US inventors in our database (top 2.4%). Patent records list Ken Harada in Fukuoka, JP.

Issued Patents All Time

Showing 1–25 of 34 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11677092	Assembly method using assembly tool	Yo Shimomura, Naoki Ishihara	2023-06-13	$175,000
11597896	Cleaning liquid, cleaning method, and method for producing semiconductor wafer	Toshiaki Shibata, Yasuhiro Kawase, Atsushi Ito, Tomohiro Kusano, Yutaro Takeshita	2023-03-07	$154,000
11551907	Electron microscope and sample observation method using the same	Keiko Shimada, Shigeo Mori, Atsuhiro Kotani	2023-01-10	$602,000
11545712	Shape correction device for frame body, and method for manufacturing electrolyte film/electrode structure provided with resin frame for fuel cell	Satoshi Hasegawa, Sachio Suzuki, Kouya Shimada, Nobuyoshi Muromoto, Hiroshi Yoshioka	2023-01-03	$107,000
11149231	Cleaning liquid, cleaning method, and method for producing semiconductor wafer	Yutaro Takeshita, Toshiaki Shibata, Kan TAKESHITA	2021-10-19
11066627	Cleaning agent composition for semiconductor device substrate, method of cleaning semiconductor device substrate, method of manufacturing semiconductor device substrate, and semiconductor device substrate	Tomohiro Kusano, Yasuhiro Kawase	2021-07-20
11024482	Holography reconstruction method and program	Kodai Niitsu, Keiko Shimada	2021-06-01
11011344	Interferometric electron microscope	Toshiaki Tanigaki, Tetsuya Akashi	2021-05-18
10948426	Particle beam device, observation method, and diffraction grating	Keiko Shimada, Kodai Niitsu	2021-03-16
10770264	Interference optical system unit, charged particle beam interference apparatus, and method for observing charged particle beam interference image	Yoh Iwasaki, Keiko Shimada	2020-09-08
10535497	Electron microscope and imaging method	Hirokazu Tamaki, Keiji Tamura, Yoshifumi Taniguchi, Hiroto Kasai, Toshie Yaguchi +1 more	2020-01-14
10210962	Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating	Teruo Kohashi, Tomohiro Iwane	2019-02-19
10113141	Cleaning liquid for semiconductor device and method for cleaning substrate for semiconductor device	Atsushi Ito, Toshiyuki Suzuki	2018-10-30
9864114	Zone plate having annular or spiral shape and Y-shaped branching edge dislocation	Teruo Kohashi	2018-01-09
9679738	Electron microscope	Hiroaki Matsumoto, Takeshi Sato, Yoshifumi Taniguchi	2017-06-13
9365802	Cleaning liquid for semiconductor device substrates and method of cleaning substrate for semiconductor devices	Atsushi Ito, Toshiyuki Suzuki	2016-06-14
8946628	Electron beam interference device and electron beam interferometry	Hiroto Kasai	2015-02-03
8785851	Interference electron microscope	Toshiaki Tanigaki, Shinji Aizawa, Tsuyoshi Matsuda, Yoshio Takahashi	2014-07-22
8772715	Electron beam device including a first electron biprism to split an electron beam into two beams and a second electron biprism in the image forming lens system to superpose the two beams	Toshiaki Tanigaki, Shinji Aizawa, Tsuyoshi Matsuda, Yoshio Takahashi	2014-07-08
8653472	Electromagnetic field application system	Akira Sugawara, Noboru Moriya	2014-02-18
8193494	Transmission electron microscope and method for observing specimen image with the same	Akira Sugawara	2012-06-05
7999652	Thick film resistor	Minoru Sakamaki, Isao Matsui	2011-08-16	$143,000
7939801	Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method	Hiroto Kasai	2011-05-10	$164,000
7923685	Electron beam device	Hiroto Kasai	2011-04-12	$130,000
7872755	Interferometer	Tetsuya Akashi, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya	2011-01-18

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Ken Harada — 34 Patents

Issued Patents All Time

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