| 12400820 |
Field emission electron source, electron optical device, and manufacturing method |
Takeshi Kawasaki |
2025-08-26 |
| 11011344 |
Interferometric electron microscope |
Toshiaki Tanigaki, Ken Harada |
2021-05-18 |
| 10872743 |
Sample holding mechanism, manufacturing method for same, and charged particle beam device |
Akira Sugawara, Yoshio Takahashi, Toshiaki Tanigaki |
2020-12-22 |
| 10629410 |
Electron microscope for magnetic field measurement and magnetic field measurement method |
Toshiaki Tanigaki, Akira Sugawara |
2020-04-21 |
| 7872755 |
Interferometer |
Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya |
2011-01-18 |
| 7816648 |
Electron interferometer or electron microscope |
Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda |
2010-10-19 |
| 7750298 |
Interferometer having three electron biprisms |
Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya |
2010-07-06 |
| 7655905 |
Charged particle beam equipment |
Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya |
2010-02-02 |
| 7538323 |
Interferometer |
Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya |
2009-05-26 |