Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12406825 | Interference scanning transmission electron microscope | Fumiaki ICHIHASHI | 2025-09-02 |
| 11011344 | Interferometric electron microscope | Tetsuya Akashi, Ken Harada | 2021-05-18 |
| 10872743 | Sample holding mechanism, manufacturing method for same, and charged particle beam device | Akira Sugawara, Yoshio Takahashi, Tetsuya Akashi | 2020-12-22 |
| 10629410 | Electron microscope for magnetic field measurement and magnetic field measurement method | Akira Sugawara, Tetsuya Akashi | 2020-04-21 |
| 8853648 | Sample holder, method for use of the sample holder, and charged particle device | Yasuhira Nagakubo, Katsuji Ito | 2014-10-07 |
| 8785851 | Interference electron microscope | Shinji Aizawa, Tsuyoshi Matsuda, Ken Harada, Yoshio Takahashi | 2014-07-22 |
| 8772715 | Electron beam device including a first electron biprism to split an electron beam into two beams and a second electron biprism in the image forming lens system to superpose the two beams | Shinji Aizawa, Tsuyoshi Matsuda, Ken Harada, Yoshio Takahashi | 2014-07-08 |
| 8729497 | Sample device for charged particle beam | Yasuhira Nagakubo, Hideki Hirota, Katsuji Ito, Takayuki Asakawa | 2014-05-20 |
| 8586922 | Transmission electron microscope and sample observation method | Isao Nagaoki, Yoshihiro Ohtsu | 2013-11-19 |
| 8426811 | Electron microscope | Isao Nagaoki | 2013-04-23 |
| D660335 | Fixation device for a sample case for an electron microscope | Yasuhira Nagakubo, Hideki Hirota, Takayuki Asakawa, Katsuji Itou | 2012-05-22 |
| D651226 | Sample case for an electron microscope | Yasuhira Nagakubo, Hideki Hirota, Takayuki Asakawa, Katsuji Itou | 2011-12-27 |
| 7700927 | Heating stage for a micro-sample | Yasuhira Nagakubo, Katsuji Itou, Takashi Kanemura, Takayuki Asakawa | 2010-04-20 |