Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10083814 | Electron microscope and sample observation method | Toshiyuki Oyagi, Hiroaki Matsumoto, Kiyotaka Nakano, Takeshi Sato, Yasuhira Nagakubo | 2018-09-25 |
| 9721752 | Sample holder and charged particle device | Yasuhira Nagakubo, Hiroaki Matsumoto, Takeshi Sato | 2017-08-01 |
| 8928485 | Charged corpuscular ray apparatus | Hideki Kikuchi, Katsuyuki Minakawa | 2015-01-06 |
| 8586922 | Transmission electron microscope and sample observation method | Toshiaki Tanigaki, Yoshihiro Ohtsu | 2013-11-19 |
| 8426811 | Electron microscope | Toshiaki Tanigaki | 2013-04-23 |
| 8288725 | Charged particle beam device | Akiko Fujisawa, Eiko Nakazawa | 2012-10-16 |
| 8044352 | Electron microscopy | Kotaro Hosoya, Yoshihiko Nakayama | 2011-10-25 |
| D636005 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Yoshifumi Taniguchi, Hiroshi Aoyagi | 2011-04-12 |
| 7838829 | Charged particle beam device | Akiko Fujisawa, Eiko Nakazawa | 2010-11-23 |
| 7838834 | Image forming method and electron microscope | Yoshihiko Nakayama, Ryoichi Ishii | 2010-11-23 |
| 7544936 | Method and device for observing a specimen in a field of view of an electron microscope | Hiromi Inada, Hiroyuki Kobayashi | 2009-06-09 |
| 7214938 | Sample observation method and transmission electron microscope | Eiko Nakazawa | 2007-05-08 |
| 7164129 | Method and device for observing a specimen in a field of view of an electron microscope | Hiromi Inada, Hiroyuki Kobayashi | 2007-01-16 |
| 7041977 | Electron microscope | Eiko Nakazawa | 2006-05-09 |
| 7022989 | Method and device for observing a specimen in a field of view of an electron microscope | Hiromi Inada, Hiroyuki Kobayashi | 2006-04-04 |
| 7012254 | Method and device for observing a specimen in a field of view of an electron microscope | Hiromi Inada, Hiroyuki Kobayashi | 2006-03-14 |
| 6982420 | Sample observation method and transmission electron microscope | Eiko Nakazawa | 2006-01-03 |
| 6888139 | Electron microscope | Ruriko Tsuneta, Masanari Koguchi, Hiroyuki Kobayashi | 2005-05-03 |
| 6878934 | Method and device for observing a specimen in a field of view of an electron | Hiromi Inada, Hiroyuki Kobayashi | 2005-04-12 |
| 6875983 | Electron microscope and means to set observation conditions | Eiko Nakazawa | 2005-04-05 |
| 6777679 | Method of observing a sample by a transmission electron microscope | Hiroyuki Kobayashi, Takafumi Yotsuji, Toshiyuki Ohyagi | 2004-08-17 |
| 6570156 | Autoadjusting electron microscope | Ruriko Tsuneta, Masanari Koguchi, Hiroyuki Kobayashi | 2003-05-27 |
| 6472663 | Electron microscope | Hiroyuki Kobayashi, Takafumi Yotsuji | 2002-10-29 |