Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10636621 | Charged particle beam device for moving an aperture having plurality of openings and sample observation method | Akinari HANAWA, Hideki Kikuchi, Toshie Yaguchi, Takashi Dobashi, Keitaro Watanabe +1 more | 2020-04-28 |
| 10535497 | Electron microscope and imaging method | Hirokazu Tamaki, Ken Harada, Keiji Tamura, Hiroto Kasai, Toshie Yaguchi +1 more | 2020-01-14 |
| 9679738 | Electron microscope | Hiroaki Matsumoto, Takeshi Sato, Ken Harada | 2017-06-13 |
| 9558910 | Sample holder for electron microscope | Shohei Terada, Yasuhira Nagakubo | 2017-01-31 |
| 8530858 | Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image | Shohei Terada | 2013-09-10 |
| 8436301 | Transmission electron microscope having electron spectrometer | Shohei Terada, Tatsumi Hirano | 2013-05-07 |
| 8263936 | Transmission electron microscope having electron spectroscope | Shohei Terada | 2012-09-11 |
| D636005 | Electron microscope | Mitsuru Oonuma, Akira Omachi, Isao Nagaoki, Hiroshi Aoyagi | 2011-04-12 |
| 7812310 | Charged particle beam apparatus and specimen holder | Hiroyuki Tanaka, Mitsugu Sato, Masashi Sasaki | 2010-10-12 |
| 7723682 | Transmission electron microscope provided with electronic spectroscope | Shohei Terada | 2010-05-25 |
| 7622714 | Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus | Toshie Yaguchi, Takeo Kamino | 2009-11-24 |
| 7385198 | Method and apparatus for measuring the physical properties of micro region | Mikio Ichihashi, Masanari Kouguchi | 2008-06-10 |
| 7381968 | Charged particle beam apparatus and specimen holder | Hiroyuki Tanaka, Mitsugu Sato, Masashi Sasaki | 2008-06-03 |
| 7235784 | Transmission electron microscope and image observation method using it | Hisafumi Otsuka | 2007-06-26 |
| 7022988 | Method and apparatus for measuring physical properties of micro region | Mikio Ichihashi, Masanari Kouguchi | 2006-04-04 |
| 6992286 | Material characterization system | Toshie Yaguchi, Takeo Kamino | 2006-01-31 |
| 6930306 | Electron microscope | Kazutoshi Kaji, Shigeto Isakozawa | 2005-08-16 |
| 6855927 | Method and apparatus for observing element distribution | Kazutoshi Kaji, Yasumitsu Ueki, Shigeto Isakozawa | 2005-02-15 |
| 6750451 | Observation apparatus and observation method using an electron beam | Masanari Koguchi, Kuniyasu Nakamura, Kaoru Umemura, Mikio Ichihashi | 2004-06-15 |
| 6150657 | Energy filter and electron microscope equipped with the energy filter | Koji Kimoto, Shunroku Taya, Shigeto Isakozawa, Takashi Aoyama, Masakazu Saito +1 more | 2000-11-21 |
| 6066852 | Electron energy filter | Shunroku Taya | 2000-05-23 |
| 5981948 | Transmission electron microscope and method of observing element distribution | Shigeto Isakozawa | 1999-11-09 |
| 5585630 | Electron energy filter and transmission electron microscope provided with the same | Shunroku Taya | 1996-12-17 |
| 5578823 | Transmission electron microscope and method of observing element distribution by using the same | — | 1996-11-26 |
| 4331213 | Automobile exhaust control system | — | 1982-05-25 |