Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183542 | Transmission electron microscope and imaging method | Hiroki KAWAMOTO, Keiji Tamura | 2024-12-31 |
| 12170184 | Transmission electron microscope and inspection method using transmission electron microscope | Keiji Tamura, Hiromi Mise, Yasuyuki Nodera, Akiko Wakui, Keisuke Igarashi | 2024-12-17 |
| 11177109 | Specimen holder and charged particle beam device provided with same | Yasuhira Nagakubo | 2021-11-16 |
| 10636621 | Charged particle beam device for moving an aperture having plurality of openings and sample observation method | Akinari HANAWA, Hideki Kikuchi, Yoshifumi Taniguchi, Takashi Dobashi, Keitaro Watanabe +1 more | 2020-04-28 |
| 10535497 | Electron microscope and imaging method | Hirokazu Tamaki, Ken Harada, Keiji Tamura, Yoshifumi Taniguchi, Hiroto Kasai +1 more | 2020-01-14 |
| 10068745 | Charged particle beam device and sample holder for charged particle beam device | Yasuhira Nagakubo, Toshiyuki Iwahori | 2018-09-04 |
| 9754762 | Electron microscope and sample observation method | Hiroyuki Kobayashi, Takafumi Yotsuji | 2017-09-05 |
| 9378922 | Electron microscope and electron microscope sample retaining device | Yasuhira Nagakubo | 2016-06-28 |
| 9099281 | Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus | Yasuhira Nagakubo, Junzo Azuma, Akira Watabe | 2015-08-04 |
| 8878144 | Electron microscope and sample holder | Yasuhira Nagakubo, Akira Watabe | 2014-11-04 |
| 8835847 | Sample holding apparatus for electron microscope, and electron microscope apparatus | Akira Watabe, Yusuke Ominami | 2014-09-16 |
| 8604429 | Electron beam device and sample holding device for electron beam device | Yasuhira Nagakubo, Takeo Kamino, Akira Watabe | 2013-12-10 |
| 8588499 | Image processing method, image processing system, and X-ray computed tomography system | Takashi Kubo, Takahito Hashimoto, Norio Baba | 2013-11-19 |
| 7863564 | Electric charged particle beam microscope and microscopy | Ruriko Tsuneta, Hideki Kikuchi, Takafumi Yotsuji | 2011-01-04 |
| 7622714 | Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus | Takeo Kamino, Yoshifumi Taniguchi | 2009-11-24 |
| 7612337 | Focused ion beam system and a method of sample preparation and observation | Yuya Suzuki, Takeo Kamino, Mitsuru Konno, Tsuyoshi Ohnishi | 2009-11-03 |
| 6992286 | Material characterization system | Takeo Kamino, Yoshifumi Taniguchi | 2006-01-31 |
| 6495838 | Sample heating holder, method of observing a sample and charged particle beam apparatus | Takeo Kamino, Masahiro Tomita, Kishio Hidaka | 2002-12-17 |
| 5898177 | Electron microscope | Kishio Hidaka, Takeo Kamino, Katsuhisa Usami, Takashi Aoyama, Shigeyoshi Nakamura +2 more | 1999-04-27 |