Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442720 | Communication adapter and program update method for communication adapter | Yasunori IMI, Naoki TAWADA | 2022-09-13 |
| 11385660 | Hot water supply system, server and non-transitory computer readable recording medium | Naoki TAWADA, Hiroshi TOSAKI, Masaharu Uchikura | 2022-07-12 |
| 11221280 | Method of preparing biological tissue sample and method of observing biological tissue section sample | Akira Sawaguchi, Eiko Nakazawa, Masahiko Ajima, Takeshi Kamimura | 2022-01-11 |
| 10795665 | Relay device and hot water supply device | Yasunori IMI, Naoki TAWADA | 2020-10-06 |
| 10671374 | Communication system, relay device, and water warmer | Daisuke HIROTA, Yasunori IMI, Naoki TAWADA | 2020-06-02 |
| 10003286 | Motor control device and steering control device | Hiroshi Kawamura, Toshihiro Takahashi, Tomohiro Niwa, Kenichi Toyozumi | 2018-06-19 |
| 8588499 | Image processing method, image processing system, and X-ray computed tomography system | Takashi Kubo, Toshie Yaguchi, Norio Baba | 2013-11-19 |
| D571385 | Electron microscope | Mitsuru Onuma, Kuniyasu Nakamura, Koichirou Saito, Hiromi Inada | 2008-06-17 |
| 7372029 | Scanning transmission electron microscope and scanning transmission electron microscopy | Ruriko Tsuneta, Masanari Koguchi, Kuniyasu Nakamura | 2008-05-13 |
| 7372051 | Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system | Ruriko Tsuneta, Hiromi Inada, Masanari Koguchi | 2008-05-13 |
| 7227144 | Scanning transmission electron microscope and scanning transmission electron microscopy | Ruriko Tsuneta, Masanari Koguchi, Kuniyasu Nakamura | 2007-06-05 |
| 6822233 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Hiroshi Kakibayashi, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato | 2004-11-23 |
| 6531697 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Hiroshi Kakibayashi, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato | 2003-03-11 |
| 5008536 | Electron microscope having electrical and mechanical position controls for specimen and positioning method | Shigeto Isakozawa | 1991-04-16 |