Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9709457 | Method of detecting defects in honeycomb structural body | Tomio Sugiyama, Yasushi Miyamura, Kouji Hori, Kazuo Matsubara | 2017-07-18 |
| 9305745 | Scanning electron microscope | Wataru MORI, Hiroyuki Ito, Yuko Sasaki | 2016-04-05 |
| 8878130 | Scanning electron microscope and scanning transmission electron microscope | Kuniyasu Nakamura | 2014-11-04 |
| 8710438 | Scanning transmission electron microscope and axial adjustment method thereof | Kuniyasu Nakamura | 2014-04-29 |
| 8304722 | Charged particle beam equipment and charged particle microscopy | Mitsugu Sato, Atsushi Takane | 2012-11-06 |
| 7923701 | Charged particle beam equipment | Hiroyuki Tanaka, Shun-ichi Watanabe, Shigeto Isakozawa, Mitsugu Sato, Atsushi Takane +1 more | 2011-04-12 |
| 7649172 | Charged particle beam equipment with magnification correction | Masaru Ozawa, Daisuke Terauchi, Hiroyuki Tanaka | 2010-01-19 |
| 7633064 | Electric charged particle beam microscopy and electric charged particle beam microscope | Ruriko Tsuneta, Masanari Koguchi | 2009-12-15 |
| 7544936 | Method and device for observing a specimen in a field of view of an electron microscope | Isao Nagaoki, Hiroyuki Kobayashi | 2009-06-09 |
| 7435957 | Charged particle beam equipment and charged particle microscopy | Mitsugu Sato, Atsushi Takane | 2008-10-14 |
| D571385 | Electron microscope | Mitsuru Onuma, Kuniyasu Nakamura, Koichirou Saito, Takahito Hashimoto | 2008-06-17 |
| 7375330 | Charged particle beam equipment | Hiroyuki Tanaka, Shun-ichi Watanabe, Shigeto Isakozawa, Mitsugu Sato, Atsushi Takane +1 more | 2008-05-20 |
| 7372051 | Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system | Ruriko Tsuneta, Masanari Koguchi, Takahito Hashimoto | 2008-05-13 |
| 7372047 | Charged particle system and a method for measuring image magnification | Mitsugu Sato, Atsushi Takane, Shigeto Isakozawa, Takashi Iizumi, Tatsuya Maeda | 2008-05-13 |
| 7164129 | Method and device for observing a specimen in a field of view of an electron microscope | Isao Nagaoki, Hiroyuki Kobayashi | 2007-01-16 |
| 7126120 | Electron microscope | — | 2006-10-24 |
| 7112294 | Method of producing ceramic body | — | 2006-09-26 |
| 7022989 | Method and device for observing a specimen in a field of view of an electron microscope | Isao Nagaoki, Hiroyuki Kobayashi | 2006-04-04 |
| 7012254 | Method and device for observing a specimen in a field of view of an electron microscope | Isao Nagaoki, Hiroyuki Kobayashi | 2006-03-14 |
| 6878934 | Method and device for observing a specimen in a field of view of an electron | Isao Nagaoki, Hiroyuki Kobayashi | 2005-04-12 |