Issued Patents All Time
Showing 1–25 of 46 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399013 | Power generation planning device and power generation planning method | Yoshihito Kinoshita, Kota Imai | 2025-08-26 |
| 12215290 | Naphthyl phenyl ether compound and lubricant composition containing same | Mayumi Hayashi, Kohei Yamashita, Masayuki Hata | 2025-02-04 |
| 12191663 | Power supply and demand planning device | Yoshihito Kinoshita, Kota Imai | 2025-01-07 |
| 9783041 | Dump truck radiator | Kyouji Uranaka, Tomoko Jinno | 2017-10-10 |
| 9000366 | Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns | Atsuko Yamaguchi, Yasunari Sohda, Osamu Nasu, Hiroki Kawada | 2015-04-07 |
| 8872106 | Pattern measuring apparatus | Hiroshi Nishihama, Mitsuji Ikeda, Susumu Koyama | 2014-10-28 |
| 8666165 | Scanning electron microscope | Satoru Yamaguchi, Takashi Iizumi, Osamu Komuro, Hidetoshi Morokuma, Juntaro Arima +1 more | 2014-03-04 |
| 8502144 | Tool-to-tool matching control method and its system for scanning electron microscope | Mayuka Oosaki, Chie Shishido, Hiroki Kawada | 2013-08-06 |
| 8384030 | Method and apparatus for setting sample observation condition, and method and apparatus for sample observation | Kazuhiro Ueda | 2013-02-26 |
| 8207512 | Charged particle beam apparatus and methods for capturing images using the same | Chie Shishido, Mayuka Oosaki, Mitsugu Sato, Hiroki Kawada | 2012-06-26 |
| 8199962 | Loudspeaker diaphragm and loudspeaker using the same | — | 2012-06-12 |
| 8200006 | Image processing apparatus for analysis of pattern matching failure | Mitsuji Ikeda, Osamu Nasu, Fumihiro Sasajima | 2012-06-12 |
| 8188427 | Scanning electron microscope alignment method and scanning electron microscope | Junichi Kakuta, Kazuhiro Ueda, Hiroyuki Saito, Katsuhiro Sasada | 2012-05-29 |
| 8124934 | Scanning electron microscope | — | 2012-02-28 |
| 8003940 | Tool-to-tool matching control method and its system for scanning electron microscope | Mayuka Oosaki, Chie Shishido, Hiroki Kawada | 2011-08-23 |
| 7807980 | Charged particle beam apparatus and methods for capturing images using the same | Chie Shishido, Mayuka Oosaki, Mitsugu Sato, Hiroki Kawada | 2010-10-05 |
| 7684937 | Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication | Atsuko Yamaguchi, Hiroshi Fukuda, Hiroki Kawada | 2010-03-23 |
| 7640509 | Program creation apparatus, program creation method and program | Takahisa Gunji | 2009-12-29 |
| 7545977 | Image processing apparatus for analysis of pattern matching failure | Mitsuji Ikeda, Osamu Nasu, Fumihiro Sasajima | 2009-06-09 |
| 7476857 | Tool-to-tool matching control method and its system for scanning electron microscope | Mayuka Oosaki, Chie Shishido, Hiroki Kawada | 2009-01-13 |
| 7446313 | Scanning electron microscope | — | 2008-11-04 |
| 7439505 | Scanning electron microscope | Satoru Yamaguchi, Takashi Iizumi, Osamu Komuro, Hidetoshi Morokuma, Juntaro Arima +1 more | 2008-10-21 |
| 7433542 | Method for measuring line and space pattern using scanning electron microscope | Atsushi Takane, Takashi Iizumi | 2008-10-07 |
| 7408154 | Scanning electron microscope, method for measuring a dimension of a pattern using the same, and apparatus for correcting difference between scanning electron microscopes | Mayuka Oosaki, Chie Shishido, Hiroki Kawada | 2008-08-05 |
| 7409080 | Inspection method of electric part | Shigenori Miyawaki | 2008-08-05 |