Issued Patents All Time
Showing 1–25 of 73 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9543135 | Mass spectrometer and mass analyzing method for efficiently ionizing a sample with less carry-over | Shun KUMANO, Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa, Masuyoshi Yamada +1 more | 2017-01-10 |
| 9281169 | Mass spectrometer | Koji Ishiguro, Shun KUMANO | 2016-03-08 |
| D748813 | Sample preparation container | Koji Ishiguro, Yukihiro Ogawa, Tsuyoshi Somekawa | 2016-02-02 |
| D746476 | Component analyzer | Hiroyuki Noda, Koji Ishiguro | 2015-12-29 |
| 9184037 | Mass spectrometer and mass analyzing method | Shun KUMANO, Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa, Masuyoshi Yamada +1 more | 2015-11-10 |
| 9171704 | Mass spectrometer | Yuichiro Hashimoto, Masuyuki Sugiyama, Masuyoshi Yamada, Hideki Hasegawa | 2015-10-27 |
| 9105453 | Mass spectrometer and mass spectrometry | Tsukasa Shishika, Masuyoshi Yamada, Hiroyuki Inoue | 2015-08-11 |
| 9006679 | Mass spectrometer | Koji Ishiguro, Shun KUMANO | 2015-04-14 |
| 8881067 | Method and apparatus for monitoring cross-sectional shape of a pattern formed on a semiconductor device | Wataru Nagatomo, Atsushi Miyamoto | 2014-11-04 |
| RE45224 | Method and apparatus for creating imaging recipe | Atsushi Miyamoto, Wataru Nagatomo, Ryoichi Matsuoka, Takumichi Sutani | 2014-10-28 |
| 8866070 | Mass spectrometer | Yuichiro Hashimoto, Masuyuki Sugiyama, Masuyoshi Yamada, Hideki Hasegawa | 2014-10-21 |
| RE45204 | Method and apparatus for creating imaging recipe | Atsushi Miyamoto, Wataru Nagatomo, Ryoichi Matsuoka, Takumichi Sutani | 2014-10-21 |
| 8853630 | Scanning electron microscope and a method for imaging a specimen using the same | Atsushi Miyamoto, Wataru Nagatomo, Ryoichi Matsuoka | 2014-10-07 |
| D711011 | Sample holder for a component analyzer | Hiroyuki Noda, Koji Ishiguro | 2014-08-12 |
| 8803084 | Mass spectrometer and mass spectrometry | Kazushige Nishimura, Yuichiro Hashimoto, Masuyuki Sugiyama, Masuyoshi Yamada | 2014-08-12 |
| D708530 | Component analyzer | Hiroyuki Noda, Mitsuru Oonuma, Yoko Sato, Kouji Ishiguro | 2014-07-08 |
| 8710430 | Mass spectrometry method | Masuyuki Sugiyama, Yuichiro Hashimoto, Shun KUMANO, Yohei Kawaguchi | 2014-04-29 |
| 8680464 | Mass spectrometer | Yuichiro Hashimoto, Hideki Hasegawa, Masuyuki Sugiyama | 2014-03-25 |
| 8669518 | Mass spectrometer | Kouji Ishiguro | 2014-03-11 |
| 8666165 | Scanning electron microscope | Satoru Yamaguchi, Takashi Iizumi, Osamu Komuro, Tatsuya Maeda, Juntaro Arima +1 more | 2014-03-04 |
| 8664588 | Mass spectrometer | Hiroyuki Noda, Mitsuru Onuma, Yoko Sato, Koji Ishiguro, Shigeo Otsuki +1 more | 2014-03-04 |
| 8642957 | Scanning electron microscope and a method for imaging a specimen using the same | Atsushi Miyamoto, Wataru Nagatomo, Ryoichi Matsuoka | 2014-02-04 |
| 8507856 | Pattern measuring method and pattern measuring device | Takumichi Sutani, Ryoichi Matsuoka, Hitoshi Komuro, Akiyuki Sugiyama | 2013-08-13 |
| 8445871 | Pattern measurement apparatus | Ryoichi Matsuoka, Akihiro Onizawa, Akiyuki Sugiyama, Yasutaka Toyoda | 2013-05-21 |
| 8368013 | Analyzer, ionization apparatus and analyzing method | Masako Ishimaru, Yuichiro Hashimoto, Hideki Hasegawa, Masuyoshi Yamada, Masuyuki Sugiyama | 2013-02-05 |