Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10545018 | Pattern measurement device, and computer program for measuring pattern | Satoru Yamaguchi, Norio Hasegawa, Akiyuki Sugiyama, Miki Isawa, Ryuji Mitsuhashi | 2020-01-28 |
| 9057873 | Global alignment using multiple alignment pattern candidates | Atsushi Miyamoto, Naoki Hosoya, Toshikazu Kawahara | 2015-06-16 |
| 8445871 | Pattern measurement apparatus | Ryoichi Matsuoka, Akiyuki Sugiyama, Hidetoshi Morokuma, Yasutaka Toyoda | 2013-05-21 |
| 7732792 | Pattern measurement apparatus | Ryoichi Matsuoka, Akiyuki Sugiyama, Hidetoshi Morokuma, Yasutaka Toyoda | 2010-06-08 |