SY

Satoru Yamaguchi

HH Hitachi High-Technologies: 32 patents #72 of 1,917Top 4%
DE Denso: 14 patents #767 of 11,792Top 7%
HI Hitachi: 9 patents #4,653 of 28,497Top 20%
Fujitsu Limited: 8 patents #3,989 of 24,456Top 20%
HM Hitachi Maxell: 3 patents #330 of 1,211Top 30%
Honda Motor Co.: 3 patents #6,619 of 21,052Top 35%
JD Japan Display: 3 patents #648 of 1,204Top 55%
HO Hoya: 2 patents #523 of 1,290Top 45%
BU Buffalo: 2 patents #26 of 80Top 35%
PC Pentax Ricoh Imaging Company: 1 patents #41 of 74Top 60%
IL Isuzu Motors Limited: 1 patents #414 of 908Top 50%
KA Kansei: 1 patents #40 of 117Top 35%
NC Nippon Petrochemicals, Co.: 1 patents #181 of 359Top 55%
FC Fuji Kiko Co.: 1 patents #99 of 208Top 50%
DA Daihen: 1 patents #169 of 305Top 60%
FL Fujitsu Vlsi Limited: 1 patents #91 of 256Top 40%
AL Alliedsignal: 1 patents #1,187 of 2,631Top 50%
Overall (All Time): #21,321 of 4,157,543Top 1%
82
Patents All Time

Issued Patents All Time

Showing 25 most recent of 82 patents

Patent #TitleCo-InventorsDate
12198327 Measurement system, method for generating learning model to be used when performing image measurement of semiconductor including predetermined structure, and recording medium for storing program for causing computer to execute processing for generating learning model to be used when performing image measurement of semiconductor including predetermined structure Ryou YUMIBA, Kei Sakai 2025-01-14
11791130 Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Makoto Sakakibara +4 more 2023-10-17
11670481 Charged particle beam device Motonobu Hommi, Kei Sakai, Hiroshi Nishihama 2023-06-06
11626266 Charged particle beam device Keiichiro Hitomi, Kenji Tanimoto, Yusuke Abe, Takuma Yamamoto, Kei Sakai +2 more 2023-04-11
11177112 Pattern measurement device and non-transitory computer readable medium having stored therein program for executing measurement Kei Sakai, Makoto Suzuki, Ryota Watanabe 2021-11-16
11170969 Electron beam observation device, electron beam observation system, and control method of electron beam observation device Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Makoto Sakakibara +2 more 2021-11-09
11011346 Electron beam device and image processing method Koichi Hamada, Kei Sakai 2021-05-18
10984980 Charged particle beam device for imaging vias inside trenches Kei Sakai, Hideki ITAI, Yasunori Takasugi, Kumiko Shimizu 2021-04-20
10976536 Image-forming device, and dimension measurement device Yasunori Takasugi, Kei Sakai, Kazuyuki Hirao 2021-04-13
10874019 Display device 2020-12-22
10665420 Charged particle beam apparatus Yasunori Takasugi, Kei Sakai, Hideki ITAI, Yoshinori Momonoi, Toshimasa Kameda +1 more 2020-05-26
10620421 Image-forming device, and dimension measurement device Yasunori Takasugi, Kei Sakai, Kazuyuki Hirao 2020-04-14
10545017 Overlay error measuring device and computer program for causing computer to measure pattern Kei Sakai, Osamu Inoue, Kazuyuki Hirao, Osamu Komuro 2020-01-28
10545018 Pattern measurement device, and computer program for measuring pattern Norio Hasegawa, Akiyuki Sugiyama, Miki Isawa, Akihiro Onizawa, Ryuji Mitsuhashi 2020-01-28
10417756 Pattern measurement apparatus and defect inspection apparatus Kei Sakai, Kazuyuki Hirao, Yasunori Takasugi 2019-09-17
10197783 Image-forming device, and dimension measurement device Yasunori Takasugi, Kei Sakai, Kazuyuki Hirao 2019-02-05
9831062 Method for pattern measurement, method for setting device parameters of charged particle radiation device, and charged particle radiation device Makoto Suzuki, Kei Sakai, Miki Isawa, Satoshi Takada, Kazuhisa Hasumi +1 more 2017-11-28
9804107 Pattern measurement device and computer program for evaluating patterns based on centroids of the patterns Akiyuki Sugiyama, Miki Isawa, Motonobu Hommi 2017-10-31
9581845 Liquid crystal display device, electronic apparatus, and method of fixing display cover Yuichi Tsubaki 2017-02-28
9540085 Ocean exploration apparatus and ocean exploration method Hideki Mizunaga 2017-01-10
9336587 Semiconductor circuit pattern measuring apparatus and method Takuma Shibahara, Michio Oikawa, Kei Sakai 2016-05-10
9329034 Pattern determination device and computer program Hitoshi Namai, Fumihiro Sasajima 2016-05-03
9119287 Display device and electronic apparatus Yuichi Tsubaki 2015-08-25
9000365 Pattern measuring apparatus and computer program Yuzuru Mochizuki, Maki Tanaka, Miki Isawa 2015-04-07
8953855 Edge detection technique and charged particle radiation equipment Hitoshi Namai, Osamu Komuro, Fumihiro Sasajima 2015-02-10