Issued Patents All Time
Showing 26–50 of 82 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8844971 | Vehicle body structure for automobile | Hirofumi Tanaka | 2014-09-30 |
| 8666165 | Scanning electron microscope | Takashi Iizumi, Osamu Komuro, Hidetoshi Morokuma, Tatsuya Maeda, Juntaro Arima +1 more | 2014-03-04 |
| 8608238 | Vehicle body structure for automobile | Hirofumi Tanaka | 2013-12-17 |
| 8571130 | Transmitting apparatus and transmission method | Daisuke Yamada, Nagahiro Matsuura, Hiroshi Katano, Masato Kato | 2013-10-29 |
| 8504833 | Relay device, wireless communications device, network system, program storage medium, and method | — | 2013-08-06 |
| 8434816 | Vehicle body structure for automobile | Hirofumi Tanaka | 2013-05-07 |
| 8405741 | Zoom adjustment system and camera | Naoto Nakahara | 2013-03-26 |
| 8263935 | Charged particle beam apparatus | Atsushi Takane, Mitsuji Ikeda, Yasuhiko Ozawa | 2012-09-11 |
| 7941008 | Pattern search method | Norio Satou, Akiyuki Sugiyama, Osamu Komuro | 2011-05-10 |
| 7826735 | Auto focus unit and digital camera | — | 2010-11-02 |
| 7800059 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro +1 more | 2010-09-21 |
| 7773145 | Auto focus unit and camera | — | 2010-08-10 |
| 7652249 | Charged particle beam apparatus | Atsushi Takane, Mitsuji Ikeda, Yasuhiko Ozawa | 2010-01-26 |
| 7633063 | Charged particle beam apparatus | Atsushi Takane, Mitsugu Sato | 2009-12-15 |
| 7605381 | Charged particle beam alignment method and charged particle beam apparatus | Mitsugu Sato, Tadashi Otaka, Makoto Ezumi, Atsushi Takane, Shoji Yoshida +1 more | 2009-10-20 |
| 7504627 | Electron beam inspection apparatus | Masakazu Takahashi, Masashi Sakamoto | 2009-03-17 |
| 7439505 | Scanning electron microscope | Takashi Iizumi, Osamu Komuro, Hidetoshi Morokuma, Tatsuya Maeda, Juntaro Arima +1 more | 2008-10-21 |
| 7361894 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro +1 more | 2008-04-22 |
| 7355174 | Charged particle beam emitting device and method for adjusting the optical axis | Mitsugu Sato, Makoto Ezumi | 2008-04-08 |
| 7256400 | Electron beam inspection apparatus | Masakazu Takahashi, Masashi Sakamoto | 2007-08-14 |
| 7166840 | Method for determining depression/protrusion of sample and charged particle beam apparatus therefor | Atsushi Takane, Osamu Komuro, Yasuhiko Ozawa, Hideo Todokoro | 2007-01-23 |
| 7164126 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro +1 more | 2007-01-16 |
| 7101165 | Extrusion molding apparatus for ceramic molded product | Yasunao Miura, Hiromi Katou | 2006-09-05 |
| 7101166 | Apparatus for extruding ceramic molding | Yasunao Miura | 2006-09-05 |
| 7090480 | Method and apparatus for molding ceramic sheet | Tadashi Tsuruta | 2006-08-15 |