Issued Patents All Time
Showing 25 most recent of 48 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12249129 | Machine learning method and information processing apparatus for machine learning | Haruhiko Higuchi | 2025-03-11 |
| 11669953 | Pattern matching device and computer program for pattern matching | Wataru Nagatomo, Yuichi Abe | 2023-06-06 |
| 10535129 | Pattern matching apparatus and computer program | Masahiro Kitazawa, Yuichi Abe, Junichi Taguchi, Wataru Nagatomo | 2020-01-14 |
| 9514526 | Device and method for detecting angle of rotation from normal position of image | Jun'ichi Taguchi, Yuichi Abe, Masahiro Kitazawa | 2016-12-06 |
| 9514528 | Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus | Junichi Taguchi, Yuichi Abe, Osamu Inoue, Takahiro Kawasaki | 2016-12-06 |
| 9183450 | Inspection apparatus | Yuichi Abe | 2015-11-10 |
| 9141879 | Pattern matching method, image processing device, and computer program | Hiroyuki Ushiba, Yasutaka Toyoda, Yuichi Abe | 2015-09-22 |
| 8971627 | Template matching processing device and template matching processing program | Jun'ichi Taguchi, Yuichi Abe, Masahiro Kitazawa, Wataru Nagatomo | 2015-03-03 |
| 8953894 | Pattern matching method and image processing device | Yoshimichi Sato, Fumihiro Sasajima | 2015-02-10 |
| 8885950 | Pattern matching method and pattern matching apparatus | Wataru Nagatomo, Yuichi Abe | 2014-11-11 |
| 8872106 | Pattern measuring apparatus | Hiroshi Nishihama, Tatsuya Maeda, Susumu Koyama | 2014-10-28 |
| 8498489 | Image inspection apparatus | Yuichi Abe, Yoshimichi Sato, Yasutaka Toyoda | 2013-07-30 |
| 8335397 | Charged particle beam apparatus | Atsushi Takane, Atsushi Kobaru | 2012-12-18 |
| 8305435 | Image processing system and scanning electron microscope | Yoshimichi Sato, Fumihiro Sasajima | 2012-11-06 |
| 8285056 | Method and apparatus for computing degree of matching | Junichi Taguchi, Osamu Komuro, Akiyuki Sugiyama | 2012-10-09 |
| 8263935 | Charged particle beam apparatus | Atsushi Takane, Satoru Yamaguchi, Yasuhiko Ozawa | 2012-09-11 |
| 8200006 | Image processing apparatus for analysis of pattern matching failure | Tatsuya Maeda, Osamu Nasu, Fumihiro Sasajima | 2012-06-12 |
| 8139868 | Image processing method for determining matching position between template and search image | Yuichi Abe, Yoshimichi Sato, Yasutaka Toyoda | 2012-03-20 |
| 8041104 | Pattern matching apparatus and scanning electron microscope using the same | Yasutaka Toyoda, Atsushi Takane | 2011-10-18 |
| 8019164 | Apparatus, method and program product for matching with a template | Junichi Taguchi | 2011-09-13 |
| 7925076 | Inspection apparatus using template matching method using similarity distribution | Yuichi Abe, Yoshimichi Satou, Yasutaka Toyoda | 2011-04-12 |
| 7652249 | Charged particle beam apparatus | Atsushi Takane, Satoru Yamaguchi, Yasuhiko Ozawa | 2010-01-26 |
| 7642514 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2010-01-05 |
| 7545977 | Image processing apparatus for analysis of pattern matching failure | Tatsuya Maeda, Osamu Nasu, Fumihiro Sasajima | 2009-06-09 |
| 7329868 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2008-02-12 |