Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11713963 | Pattern shape evaluation device, pattern shape evaluation system, and pattern shape evaluation method | Atsuko Shintani, Kazuhisa Hasumi, Masami Ikota, Hiroki Kawada | 2023-08-01 |
| 11447869 | Manufacturing method for solar cell, solar cell, and solar cell manufacturing apparatus | Masahiro YOKOGAWA | 2022-09-20 |
| 10665424 | Pattern measuring method and pattern measuring apparatus | Hiroki Kawada, Junichi Kakuta | 2020-05-26 |
| 9702695 | Image processing device, charged particle beam device, charged particle beam device adjustment sample, and manufacturing method thereof | Hiroki Kawada, Osamu Inoue, Miyako Matsui, Naoshi Itabashi, Takashi Takahama +2 more | 2017-07-11 |
| 9537026 | Method for manufacturing solar-power-generator substrate and apparatus for manufacturing solar-power-generator substrate | Hajime Tsugeno, Mitsuhiro Nonogaki, Junji Kobayashi, Yusuke Oshiro, Shoichi Karakida | 2017-01-03 |
| 9514528 | Image processing apparatus, distortion-corrected map creation apparatus, and semiconductor measurement apparatus | Junichi Taguchi, Mitsuji Ikeda, Yuichi Abe, Osamu Inoue | 2016-12-06 |
| 9136567 | Chuck mechanism of charge-discharge test device for thin secondary battery | Takashi Nishihara, Tsutomu Okazaki, Takeshi Yasooka, Yoshikazu Niwa | 2015-09-15 |
| 8742375 | Scanning electron microscope device, evaluation point generating method, and program | — | 2014-06-03 |
| 8618804 | Chuck mechanism of charge/discharge testing device for flat-rechargeable batteries | Takashi Nishihara, Tsutomu Okazaki, Takeshi Yasooka, Hiroaki Habe, Yoshikazu Niwa | 2013-12-31 |
| 6046488 | Semiconductor device having conductive layer and manufacturing method thereof | Shigeru Harada, Hiroshi Tobimatsu | 2000-04-04 |
| 4726855 | Method of annealing a core | Kenzo Tsutsui, Tatsuo Ito, Kazuo Yamada | 1988-02-23 |