Issued Patents All Time
Showing 25 most recent of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12311378 | Sample crushing device | Atsushi Watanabe, Chuichi Watanabe | 2025-05-27 |
| 10910394 | Semiconductor device | Akira Kato, Kan Yasui, Kyoya Nitta, Digh Hisamoto, Yasushi Ishii +3 more | 2021-02-02 |
| 10692878 | Semiconductor device | Akira Kato, Kan Yasui, Kyoya Nitta, Digh Hisamoto, Yasushi Ishii +3 more | 2020-06-23 |
| 10424665 | Semiconductor device and method of manufacturing the semiconductor device | Shinichi Okamoto | 2019-09-24 |
| 10396089 | Semiconductor device | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2019-08-27 |
| 10141324 | Semiconductor device | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2018-11-27 |
| 9640546 | Semiconductor device | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2017-05-02 |
| 9136567 | Chuck mechanism of charge-discharge test device for thin secondary battery | Takashi Nishihara, Takahiro Kawasaki, Takeshi Yasooka, Yoshikazu Niwa | 2015-09-15 |
| 8963226 | Semiconductor device with gate electrodes | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2015-02-24 |
| 8753060 | Article transfer device | Yuichi Ueda, Masashige Iwata, Takashi Nishihara, Kazuhiko Kodera | 2014-06-17 |
| 8618804 | Chuck mechanism of charge/discharge testing device for flat-rechargeable batteries | Takashi Nishihara, Takahiro Kawasaki, Takeshi Yasooka, Hiroaki Habe, Yoshikazu Niwa | 2013-12-31 |
| 8546867 | Non-volatile memory semiconductor device | Hiraku Chakihara | 2013-10-01 |
| 8390048 | Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device | Takeshi Sakai, Yasushi Ishii, Masaru Nakamichi, Toshikazu Matsui, Kyoya Nitta +3 more | 2013-03-05 |
| 8357968 | Non-volatile memory semiconductor device | Hiraku Chakihara | 2013-01-22 |
| 8319265 | Semiconductor device with improved common source arrangement for adjacent non-volatile memory cells | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2012-11-27 |
| 7939448 | Semiconductor device having electrode and manufacturing method thereof | Motoi Ashida, Hiroji Ozaki, Tsuyoshi Koga, Daisuke Okada | 2011-05-10 |
| 7863135 | Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device | Takeshi Sakai, Yasushi Ishii, Masaru Nakamichi, Toshikazu Matsui, Kyoya Nitta +3 more | 2011-01-04 |
| 7816207 | Semiconductor device having electrode and manufacturing method thereof | Motoi Ashida, Hiroji Ozaki, Tsuyoshi Koga, Daisuke Okada | 2010-10-19 |
| 7709874 | Semiconductor device having a split gate structure with a recessed top face electrode | Motoi Ashida, Hiroji Ozaki, Tsuyoshi Koga, Daisuke Okada | 2010-05-04 |
| 7663176 | Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device | Takeshi Sakai, Yasushi Ishii, Masaru Nakamichi, Toshikazu Matsui, Kyoya Nitta +3 more | 2010-02-16 |
| 7636253 | Semiconductor device | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2009-12-22 |
| 7502257 | Semiconductor device | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2009-03-10 |
| 7371631 | Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device | Takeshi Sakai, Yasushi Ishii, Masaru Nakamichi, Toshikazu Matsui, Kyoya Nitta +3 more | 2008-05-13 |
| 7245531 | Semiconductor device | Daisuke Okada, Kyoya Nitta, Toshihiro Tanaka, Akira Kato, Toshikazu Matsui +3 more | 2007-07-17 |
| 7095074 | Semiconductor device with reduced memory leakage current | Keisuke Tsukamoto, Yoshihiro Ikeda, Daisuke Okada, Hiroshi Yanagita | 2006-08-22 |