Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12237145 | Charged particle beam device and inspection device | Makoto Suzuki, Hiroki Kawada | 2025-02-25 |
| 11713963 | Pattern shape evaluation device, pattern shape evaluation system, and pattern shape evaluation method | Takahiro Kawasaki, Kazuhisa Hasumi, Masami Ikota, Hiroki Kawada | 2023-08-01 |
| 11430106 | Image processing device, image processing method and charged particle microscope | Takeyoshi Ohashi, Masami Ikota, Kazuhisa Hasumi | 2022-08-30 |
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Momoyo Enyama, Makoto Sakakibara, Sayaka KURATA +6 more | 2022-07-05 |
| 11276551 | Inspection device | Yasunari Sohda, Noritsugu Takahashi, Hikaru Koyama | 2022-03-15 |