Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Momoyo Enyama, Makoto Sakakibara, Atsuko Shintani +6 more | 2022-07-05 |
| 11334761 | Information processing system and information processing method | Thantip Krasienapibal, Momoyo Enyama, Yasuhiro Shirasaki | 2022-05-17 |
| 10483083 | Scanning electron microscope and image processing apparatus | Thantip Krasienapibal, Yasuhiro Shirasaki, Momoyo Enyama | 2019-11-19 |