Issued Patents All Time
Showing 25 most recent of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10426352 | Object information acquiring apparatus, information processing apparatus and object information acquiring method | — | 2019-10-01 |
| 9924876 | Object information acquiring apparatus and method of controlling same | — | 2018-03-27 |
| 9664782 | Object information acquiring apparatus | — | 2017-05-30 |
| 9390068 | Signal processing circuit and ultrasonic diagnostic apparatus | — | 2016-07-12 |
| 9364152 | Object information acquiring apparatus | Katsuya Oikawa | 2016-06-14 |
| 9247881 | Measurement apparatus, movement control method, and program | — | 2016-02-02 |
| 9247923 | Received data processing apparatus of photoacoustic tomography | Yoshitaka Baba, Kazuhiko Fukutani | 2016-02-02 |
| 9165552 | Ultrasonic imaging apparatus and method of controlling delay | Katsuya Oikawa | 2015-10-20 |
| 9116225 | Measuring apparatus | Katsuya Oikawa, Kenichi Nagae | 2015-08-25 |
| 9063220 | Object information acquiring apparatus | Kenichi Nagae, Katsuya Oikawa | 2015-06-23 |
| 8929174 | Acoustic wave imaging apparatus and acoustic wave imaging method | Kenichi Nagae | 2015-01-06 |
| 8920321 | Photoacoustic imaging apparatus | — | 2014-12-30 |
| 8692218 | Charged particle beam exposure apparatus | Masato Muraki | 2014-04-08 |
| 8008622 | Electron beam apparatus and method of generating an electron beam irradiation pattern | Ryo Fujita, Kimiaki Ando, Yuji Inoue, Masato Muraki | 2011-08-30 |
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Kimiaki Ando, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2011-05-31 |
| 7915582 | Method for estimation of probe shape in charged particle beam instruments | Kotoko Hirose, Takeshi Kawasaki, Tomonori Nakano | 2011-03-29 |
| 7692166 | Charged particle beam exposure apparatus | Masato Muraki | 2010-04-06 |
| 7642514 | Charged particle beam apparatus | Atsushi Takane, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida, Mitsuji Ikeda +2 more | 2010-01-05 |
| 7635851 | Electron beam apparatus and method of generating an electron beam irradiation pattern | Ryo Fujita, Kimiaki Ando, Yuji Inoue, Masato Muraki | 2009-12-22 |
| 7608844 | Charged particle beam drawing apparatus | Yuji Inoue, Kimiaki Ando, Yoshikiyo Yui | 2009-10-27 |
| 7417444 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Kimiaki Ando, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2008-08-26 |
| 7329868 | Charged particle beam apparatus | Atsushi Takane, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida, Mitsuji Ikeda +2 more | 2008-02-12 |
| 7235782 | Semiconductor inspection system | Atsushi Takane, Shoji Yoshida, Mitsuji Ikeda, Yasuhiko Ozawa | 2007-06-26 |
| 7126140 | Multi-electron beam exposure method and apparatus | Yasunari Souda, Hiroya Ohta, Yoshikiyo Yui, Shinichi Hashimoto | 2006-10-24 |
| 7109485 | Charged particle beam apparatus | Atsushi Takane, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida, Mitsuji Ikeda +2 more | 2006-09-19 |