Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8937714 | Inspecting apparatus and inspecting method | Hiroshi Kikuchi, Yuji Inoue | 2015-01-20 |
| 8008622 | Electron beam apparatus and method of generating an electron beam irradiation pattern | Ryo Fujita, Haruo Yoda, Yuji Inoue, Masato Muraki | 2011-08-30 |
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2011-05-31 |
| 7643462 | Selective storing order method in CDMA receiver | — | 2010-01-05 |
| 7635851 | Electron beam apparatus and method of generating an electron beam irradiation pattern | Ryo Fujita, Haruo Yoda, Yuji Inoue, Masato Muraki | 2009-12-22 |
| 7608844 | Charged particle beam drawing apparatus | Yuji Inoue, Haruo Yoda, Yoshikiyo Yui | 2009-10-27 |
| 7417444 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2008-08-26 |
| 7313173 | Correlation detection method and apparatus, transmission diversity detection method and apparatus, each method and apparatus for detection within a small time unit | — | 2007-12-25 |
| 7026830 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2006-04-11 |
| 6977956 | Pilot signal reception method and receiver | Hiroki Shinde | 2005-12-20 |
| 6559663 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2003-05-06 |
| 6525519 | Amplitude detecting circuit | Hiroki Shinde | 2003-02-25 |
| 6403973 | Electron beam exposure method and apparatus and semiconductor device manufactured using the same | Hiroyuki Takahashi, Masahide Okumura, Koji Nagata | 2002-06-11 |
| 6373708 | Contactless IC card | Takehiro Ohkawa, Kazuo Kaneko | 2002-04-16 |
| 6352202 | Method and system for controlling contactless IC cards | Masahiro Takiguchi, Kiyoshi Takahashi, Tatsuya Hirata, Shigeru Date, Hisanobu Dobashi +4 more | 2002-03-05 |
| 6329826 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2001-12-11 |
| 6172363 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Katsuhiro Kuroda, Yutaka Kaneko +12 more | 2001-01-09 |
| 5999409 | Contactless IC card | Takehiro Ohkawa, Kazuo Kaneko | 1999-12-07 |
| 5197097 | Cell signal processing circuit and optical switch apparatus using the same | Yasushi Takahashi, Eiichi Amada, Masanori Miyata | 1993-03-23 |
| 4943729 | Electron beam lithography system | Mitsuo Ooyama, Norio Saitou | 1990-07-24 |
| 4820928 | Lithography apparatus | Mitsuo Ooyama, Yoshio Kawamura, Norio Saitou, Takanori Simura, Hiroyuki Kohida | 1989-04-11 |
| 4758973 | Apparatus for processing floating-point data having exponents of a variable length | Mitsuo Ooyama, Hozumi Hamada | 1988-07-19 |
| 4580236 | Graphic display apparatus with a vector generating circuit | Shigeo Tsujioka, Eiji Okamura, Mitsuo Ooyama, Seiichi Kanema, Mitsugu Yoneyama +2 more | 1986-04-01 |