Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8541871 | Multilayered lead frame for a semiconductor light-emitting device | Hidekazu Tomohiro, Masayuki Fujii, Tomoyuki Yamada, Tomio Kusano | 2013-09-24 |
| 8280148 | Pattern defect analysis equipment, pattern defect analysis method and pattern defect analysis program | Susumu Koyama, Masashi Sakamoto, Kenji Obara | 2012-10-02 |
| 8203504 | Image forming method and charged particle beam apparatus | Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada +2 more | 2012-06-19 |
| 8121393 | Pattern defect analysis equipment, pattern defect analysis method and pattern defect analysis program | Susumu Koyama, Masashi Sakamoto, Kenji Obara | 2012-02-21 |
| 7994616 | Multilayered lead frame for a semiconductor light-emitting device | Hidekazu Tomohiro, Masayuki Fujii, Tomoyuki Yamada, Tomio Kusano | 2011-08-09 |
| 7941008 | Pattern search method | Akiyuki Sugiyama, Osamu Komuro, Satoru Yamaguchi | 2011-05-10 |
| 7817105 | Image forming method and charged particle beam apparatus | Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada +2 more | 2010-10-19 |
| 7692277 | Multilayered lead frame for a semiconductor light-emitting device | Hidekazu Tomohiro, Masayuki Fujii, Tomoyuki Yamada, Tomio Kusano | 2010-04-06 |
| 7187345 | Image forming method and charged particle beam apparatus | Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada +2 more | 2007-03-06 |