Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11914248 | Photo-alignment copolymer, photo-alignment film, and optical laminate | Yutaka Nozoe, Kazushige Nakagawa, Takahiro Kato, Miho ASAHI, Hirofumi Omura +1 more | 2024-02-27 |
| 11827727 | Photo-alignment polymer, binder composition, binder layer, optical laminate, optical laminate manufacturing method, and image display device | Soichiro Watanabe, Yutaka Nozoe, Akio Tamura, Tomoaki Yokota, Keisuke YOSHIMASA +1 more | 2023-11-28 |
| 11692050 | Photo-alignment copolymer, binder composition, binder layer, optical laminate, and image display device | Yutaka Nozoe, Soichiro Watanabe, Hideyuki Nishikawa, Kazushige Nakagawa, Kunihiro Atsumi | 2023-07-04 |
| 11319393 | Photo-alignable polymer, binder composition, binder layer, optical laminate, method for producing optical laminate, and image display device | Akio Tamura, Reiko INUSHIMA, Yutaka Nozoe, Hideyuki Nishikawa, Kazushige Nakagawa +1 more | 2022-05-03 |
| 10662332 | Compound, coloring composition for dyeing or textile printing, ink for ink jet textile printing, method of printing on fabric, and dyed or printed fabric | Kazunari Yagi, Keiichi Tateishi | 2020-05-26 |
| 10487210 | Coloring composition for textile printing, textile printing method, ink for ink jet textile printing, and dyed fabric | Kazunari Yagi, Keiichi Tateishi, Akihiro Hakamata, Yoshihiko Fujie | 2019-11-26 |
| 8666165 | Scanning electron microscope | Satoru Yamaguchi, Osamu Komuro, Hidetoshi Morokuma, Tatsuya Maeda, Juntaro Arima +1 more | 2014-03-04 |
| 7910886 | Sample dimension measuring method and scanning electron microscope | Hiroki Kawada, Tadashi Otaka | 2011-03-22 |
| 7849304 | System and method for on-line diagnostics | Juntaro Arima, Masaaki Inaba | 2010-12-07 |
| 7805023 | Image evaluation method and microscope | Tohru Ishitani, Mitsugu Sato, Hideo Todokoro, Tadashi Otaka, Atsushi Takane | 2010-09-28 |
| 7800059 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Tadashi Otaka, Hideo Todokoro, Satoru Yamaguchi +1 more | 2010-09-21 |
| 7551976 | Industrial device receiving remote maintenance operation and outputting charge information | Juntaro Arima, Masaaki Inaba, Takeiki Aizono | 2009-06-23 |
| 7439505 | Scanning electron microscope | Satoru Yamaguchi, Osamu Komuro, Hidetoshi Morokuma, Tatsuya Maeda, Juntaro Arima +1 more | 2008-10-21 |
| 7433542 | Method for measuring line and space pattern using scanning electron microscope | Atsushi Takane, Tatsuya Maeda | 2008-10-07 |
| 7372047 | Charged particle system and a method for measuring image magnification | Mitsugu Sato, Atsushi Takane, Shigeto Isakozawa, Tatsuya Maeda, Hiromi Inada | 2008-05-13 |
| 7373501 | System and method for on-line diagnostics | Juntaro Arima, Masaaki Inaba | 2008-05-13 |
| 7369703 | Method and apparatus for circuit pattern inspection | Atsuko Yamaguchi, Tsuneo Terasawa, Tadashi Otaka, Osamu Komuro | 2008-05-06 |
| 7361894 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Tadashi Otaka, Hideo Todokoro, Satoru Yamaguchi +1 more | 2008-04-22 |
| 7340111 | Image evaluation method and microscope | Tohru Ishitani, Mitsugu Sato, Hideo Todokoro, Tadashi Otaka, Atsushi Takane | 2008-03-04 |
| 7285777 | Sample dimension measuring method and scanning electron microscope | Hiroki Kawada, Tadashi Otaka | 2007-10-23 |
| 7236651 | Image evaluation method and microscope | Tohru Ishitani, Mitsugu Sato, Hideo Todokoro, Tadashi Otaka, Atsushi Takane | 2007-06-26 |
| 7177715 | Remote maintenance method for generating maintenance charge information, industrial device, and semiconductor device | Juntaro Arima, Masaaki Inaba, Takeiki Aizono | 2007-02-13 |
| 7164126 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Tadashi Otaka, Hideo Todokoro, Satoru Yamaguchi +1 more | 2007-01-16 |
| 7095884 | Method and apparatus for circuit pattern inspection | Atsuko Yamaguchi, Tsuneo Terasawa, Tadashi Otaka, Osamu Komuro | 2006-08-22 |
| 7047096 | Remote maintenance method, industrial device, and semiconductor device | Juntaro Arima, Masaaki Inaba, Takeiki Aizono | 2006-05-16 |