Issued Patents All Time
Showing 1–25 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8134131 | Method and apparatus for observing inside structures, and specimen holder | Shohei Terada, Kazutoshi Kaji | 2012-03-13 |
| 7928376 | Element mapping unit, scanning transmission electron microscope, and element mapping method | Kazutoshi Kaji, Kazuhiro Ueda, Koji Kimoto, Takashi Aoyama, Shunroku Taya | 2011-04-19 |
| 7923701 | Charged particle beam equipment | Hiromi Inada, Hiroyuki Tanaka, Shun-ichi Watanabe, Mitsugu Sato, Atsushi Takane +1 more | 2011-04-12 |
| 7476872 | Method and apparatus for observing inside structures, and specimen holder | Shohei Terada, Kazutoshi Kaji | 2009-01-13 |
| 7462830 | Method and apparatus for observing inside structures, and specimen holder | Shohei Terada, Kazutoshi Kaji | 2008-12-09 |
| 7375330 | Charged particle beam equipment | Hiromi Inada, Hiroyuki Tanaka, Shun-ichi Watanabe, Mitsugu Sato, Atsushi Takane +1 more | 2008-05-20 |
| 7372047 | Charged particle system and a method for measuring image magnification | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tatsuya Maeda, Hiromi Inada | 2008-05-13 |
| 7250601 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Kazutoshi Kaji, Takashi Aoyama, Shunroku Taya | 2007-07-31 |
| 7146872 | Micro manipulator | Kazuhiro Morita, Motohide Ukiana, Kazuhiro Fujii, Hidemi Koike, Tamio Tanikawa | 2006-12-12 |
| 7067805 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Kazutoshi Kajl, Takashi Aoyama, Shunroku Taya | 2006-06-27 |
| 6933501 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Kazutoshi Kaji, Takashi Aoyama, Shunroku Taya, Hiroyuki Tanaka | 2005-08-23 |
| 6930306 | Electron microscope | Kazutoshi Kaji, Yoshifumi Taniguchi | 2005-08-16 |
| 6855927 | Method and apparatus for observing element distribution | Yoshifumi Taniguchi, Kazutoshi Kaji, Yasumitsu Ueki | 2005-02-15 |
| 6822233 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Hiroshi Kakibayashi, Mikio Ichihashi, Yuji Sato, Takahito Hashimoto | 2004-11-23 |
| 6794648 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Kazutoshi Kaji, Takashi Aoyama, Shunroku Taya, Hiroyuki Tanaka | 2004-09-21 |
| 6703613 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Kazutoshi Kaji, Takashi Aoyama, Shunroku Taya | 2004-03-09 |
| 6566654 | Inspection of circuit patterns for defects and analysis of defects using a charged particle beam | Ryuichi Funatsu, Hidemi Koike | 2003-05-20 |
| 6531697 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Hiroshi Kakibayashi, Mikio Ichihashi, Yuji Sato, Takahito Hashimoto | 2003-03-11 |
| 6150657 | Energy filter and electron microscope equipped with the energy filter | Koji Kimoto, Yoshifumi Taniguchi, Shunroku Taya, Takashi Aoyama, Masakazu Saito +1 more | 2000-11-21 |
| 6051834 | Electron microscope | Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi +7 more | 2000-04-18 |
| 5981948 | Transmission electron microscope and method of observing element distribution | Yoshifumi Taniguchi | 1999-11-09 |
| 5866905 | Electron microscope | Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi +7 more | 1999-02-02 |
| 5783830 | Sample evaluation/process observation system and method | Hiroshi Hirose, Hidemi Koike, Yuji Sato, Mikio Ichihashi, Motohide Ukiana | 1998-07-21 |
| 5717207 | Transmission electron microscope with camera system | Masanari Koguchi, Hiroshi Kakibayashi, Hiroyuki Tanaka, Keiichi Kanehori, Tatsuo Makishima +1 more | 1998-02-10 |
| 5552602 | Electron microscope | Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Tadokoro, Katsuhiro Kuroda, Masanari Koguchi +3 more | 1996-09-03 |