Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10373802 | Transmission scanning microscopy including electron energy loss spectroscopy and observation method thereof | Yu YAMAZAWA | 2019-08-06 |
| 8901493 | Electron microscope | — | 2014-12-02 |
| 8344320 | Electron microscope with electron spectrometer | Shohei Terada, Yoshihumi Taniguchi | 2013-01-01 |
| 8134131 | Method and apparatus for observing inside structures, and specimen holder | Shohei Terada, Shigeto Isakozawa | 2012-03-13 |
| 7928376 | Element mapping unit, scanning transmission electron microscope, and element mapping method | Kazuhiro Ueda, Koji Kimoto, Takashi Aoyama, Shunroku Taya, Shigeto Isakozawa | 2011-04-19 |
| 7888641 | Electron microscope with electron spectrometer | Shohei Terada, Yoshihumi Taniguchi | 2011-02-15 |
| 7872232 | Electronic microscope apparatus | — | 2011-01-18 |
| 7544935 | Method and apparatus for evaluating thin films | Shohei Terada, Tatsumi Hirano, Gyeong Su Park, Se-ahn Song, Jong-bong Park | 2009-06-09 |
| 7476872 | Method and apparatus for observing inside structures, and specimen holder | Shohei Terada, Shigeto Isakozawa | 2009-01-13 |
| 7462830 | Method and apparatus for observing inside structures, and specimen holder | Shohei Terada, Shigeto Isakozawa | 2008-12-09 |
| 7250601 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Takashi Aoyama, Shunroku Taya, Shigeto Isakozawa | 2007-07-31 |
| 7053372 | Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the same | Gyeong Su Park, Jong-bong Park, Shohei Terada, Tatsumi Hirano, Se-ahn Song | 2006-05-30 |
| 6933500 | Electron microscope | Shohei Terada, Tadashi Otaka | 2005-08-23 |
| 6933501 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Takashi Aoyama, Shunroku Taya, Hiroyuki Tanaka, Shigeto Isakozawa | 2005-08-23 |
| 6930306 | Electron microscope | Yoshifumi Taniguchi, Shigeto Isakozawa | 2005-08-16 |
| 6855927 | Method and apparatus for observing element distribution | Yoshifumi Taniguchi, Yasumitsu Ueki, Shigeto Isakozawa | 2005-02-15 |
| 6794648 | Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method | Takashi Aoyama, Shunroku Taya, Hiroyuki Tanaka, Shigeto Isakozawa | 2004-09-21 |
| 6703613 | Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method | Takashi Aoyama, Shunroku Taya, Shigeto Isakozawa | 2004-03-09 |
| 5650043 | Etching method using NH.sub.4 F solution to make surface of silicon smooth in atomic order | Shueh Lin Yau, Kingo Itaya, Toshihiko Sakuhara | 1997-07-22 |