RF

Ryuichi Funatsu

HI Hitachi: 9 patents #4,653 of 28,497Top 20%
HH Hitachi High-Technologies: 9 patents #300 of 1,917Top 20%
HS Hitachi Science Systems: 1 patents #30 of 77Top 40%
Overall (All Time): #258,540 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8193493 Charged particle beam apparatus Sayaka Tanimoto, Hiroya Ohta, Hiroshi Makino 2012-06-05
7906761 Charged particle beam apparatus Sayaka Tanimoto, Hiroya Ohta, Hiroshi Makino 2011-03-15
7880143 Electron beam apparatus Sayaka Tanimoto, Hiroya Ohta, Hiroshi Makino 2011-02-01
7855363 Inspection method and apparatus using an electron beam Hiroshi Miyai, Taku Ninomiya, Yasuhiko Nara 2010-12-21
7425704 Inspection method and apparatus using an electron beam Hiroshi Miyai, Taku Ninomiya, Yasuhiko Nara 2008-09-16
7271385 Inspection method and inspection apparatus using electron beam Yasuhiro Gunji, Taku Ninomiya, Yoshikazu Inada, Kenjirou Yamamoto, Mari Nozoe 2007-09-18
7081625 Charged particle beam apparatus Masanari Furiki, Kouichi Kurosawa, Takehiko Konno 2006-07-25
7071468 Circuit pattern inspection method and its apparatus Hiroshi Miyai, Taku Ninomiya, Yasuhiko Nara 2006-07-04
7034298 Inspection method and apparatus using an electron beam Hiroshi Miyai, Taku Ninomiya, Yasuhiko Nara 2006-04-25
6566654 Inspection of circuit patterns for defects and analysis of defects using a charged particle beam Shigeto Isakozawa, Hidemi Koike 2003-05-20
5195070 Optical information processing apparatus and optical pickup therefor Masataka Shiba, Kazumi Kawamoto, Yasuo Hira, Akira Inagaki, Hidemi Sato +2 more 1993-03-16
5134298 Beam control method and apparatus Akira Inagaki, Yasuhiko Nakayama 1992-07-28
5125740 Method and apparatus for measuring optical constants of a thin film as well as method and apparatus for fabricating a thin film utilizing same Hidemi Sato, Yasuo Hira, Atsuko Fukushima, Hiroshi Asao, Kazumi Kawamoto +1 more 1992-06-30
5121449 Information detecting system of scanning type Masataka Shiba, Motoya Taniguchi, Minoru Tanaka, Akira Inagaki 1992-06-09
5008702 Exposure method and apparatus Tsutomu Tanaka, Yoshitada Oshida, Masataka Shiba, Naoto Nakashima 1991-04-16
4852133 X-ray lithography apparatus Minoru Ikeda, Yukio Kembo, Motoya Taniguchi 1989-07-25
4777641 Method and apparatus for alignment Akira Inagaki, Yukio Kembo, Asahiro Kuni, Keiichi Okamoto, Yoshihiro Komeyama 1988-10-11
4666291 Light-exposure apparatus Motoya Taniguchi, Asahiro Kuni, Yukio Kembo, Akira Inagaki 1987-05-19