Issued Patents All Time
Showing 25 most recent of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9598528 | Modified epoxy resin composition | Toshiaki Takeyama | 2017-03-21 |
| 8900376 | Heat-resistant water-soluble flux composition for soldering | Toshiaki Takeyama | 2014-12-02 |
| 8565509 | Circuit pattern inspecting apparatus, management system including circuit pattern inspecting apparatus, and method for inspecting circuit pattern | Hiroyuki Takahashi, Hirokazu Ito | 2013-10-22 |
| 8421010 | Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample | Takashi Hiroi, Hiroshi Miyai, Masaaki Nojiri | 2013-04-16 |
| 8242443 | Semiconductor device inspection apparatus | Yusuke Ominami, Yoshiyuki Shichida | 2012-08-14 |
| 8207513 | Charged particle beam apparatus | Yuko Sasaki, Zhaohui Cheng | 2012-06-26 |
| 8168950 | Charged particle beam apparatus, and image generation method with charged particle beam apparatus | Kanji Furuhashi, Shuji Kikuchi, Akira Karakama | 2012-05-01 |
| 8086021 | Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope | Yusuke Ominami, Hiroshi Miyai | 2011-12-27 |
| 8086022 | Electron beam inspection system and an image generation method for an electron beam inspection system | Hiroshi Miyai, Yusuke Ominami | 2011-12-27 |
| 7999565 | Inspection apparatus and inspection method using electron beam | Hiroshi Miyai, Shigeya Tanaka | 2011-08-16 |
| 7838828 | Semiconductor device inspection apparatus | Yusuke Ominami, Yoshiyuki Shichida | 2010-11-23 |
| 7518383 | Inspection apparatus and inspection method using electron beam | Hiroshi Miyai, Shigeya Tanaka | 2009-04-14 |
| 7439504 | Pattern inspection method and apparatus using electron beam | Takashi Hiroi, Asahiro Kuni, Masahiro Watanabe, Chie Shishido, Hiroyuki Shinada +1 more | 2008-10-21 |
| 7348558 | Charged particle beam apparatus and automatic astigmatism adjustment method | Masahiro Watanabe, Hiroyuki Shinada, Atsuko Takafuji, Masami Iizuka, Kouichi Hayakawa +1 more | 2008-03-25 |
| 7271385 | Inspection method and inspection apparatus using electron beam | Taku Ninomiya, Ryuichi Funatsu, Yoshikazu Inada, Kenjirou Yamamoto, Mari Nozoe | 2007-09-18 |
| 7030394 | Charged particle beam apparatus and automatic astigmatism adjustment method | Masahiro Watanabe, Hiroyuki Shinada, Atsuko Takafuji, Masami Iizuka, Kouichi Hayakawa +1 more | 2006-04-18 |
| 6940069 | Pattern inspection method and apparatus using electron beam | Takashi Hiroi, Asahiro Kuni, Masahiro Watanabe, Chie Shishido, Hiroyuki Shinada +1 more | 2005-09-06 |
| 6903212 | Method for reducing an organic solvent remaining in β-form tris- (2,3,-epoxypropyl)—isocyanurate crystals | Hisao Ikeda, Motohiko Hidaka | 2005-06-07 |
| 6825480 | Charged particle beam apparatus and automatic astigmatism adjustment method | Masahiro Watanabe, Hiroyuki Shinada, Atsuko Takafuji, Masami Iizuka, Kouichi Hayakawa +1 more | 2004-11-30 |
| 6714861 | Map displaying method and apparatus, and navigation system having the map displaying apparatus | Mariko Okude, Yoshinori Endo, Kozo Nakamura | 2004-03-30 |
| 6614022 | Pattern inspection method and apparatus using electron beam | Takashi Hiroi, Asahiro Kuni, Masahiro Watanabe, Chie Shishido, Hiroyuki Shinada +1 more | 2003-09-02 |
| 6605718 | Method for reducing organic solvents remaining in tris-(2,3-epoxypropyl)-isocyanurate crystals | Hisao Ikeda, Motohiko Hidaka | 2003-08-12 |
| 6486472 | Inspecting system using electron beam and inspecting method using same | Taku Ninomiya, Masatsugu Kametani, Masahiro Koyama, Kenjiro Yamamoto | 2002-11-26 |
| 6341254 | Map displaying method and apparatus, and navigation system having the map displaying apparatus | Mariko Okude, Yoshinori Endo, Kozo Nakamura | 2002-01-22 |
| 6177541 | Process for producing an isocyanurate derivative | Hisao Ikeda, Toshinari Koda | 2001-01-23 |