Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10437589 | Distributed processing control system and distributed processing control method | Go Nakamoto, Shuichiro Shinkai | 2019-10-08 |
| 9413040 | Secondary battery unit | Manabu Murakami, Shigenori Kawana, Sakae Kawashima | 2016-08-09 |
| 8653458 | Charged particle beam device | Yoshiro Gunji | 2014-02-18 |
| 8385627 | Method and apparatus for inspecting defects of semiconductor device | Tadanobu Toba, Yuichi Sakurai, Wen Li | 2013-02-26 |
| 8168950 | Charged particle beam apparatus, and image generation method with charged particle beam apparatus | Kanji Furuhashi, Akira Karakama, Yasuhiro Gunji | 2012-05-01 |
| 8032332 | Semiconductor inspecting apparatus | Yuichi Sakurai, Tadanobu Toba | 2011-10-04 |
| 7546506 | DRAM stacked package, DIMM, and semiconductor manufacturing method | Yuji Sonoda, Katsunori Hirano, Ichiro Anjo, Mitsuaki Katagiri | 2009-06-09 |
| 7225372 | Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory | Iwao Suzuki, Fumie Kobayashi, Hideyuki Aoki | 2007-05-29 |
| 7137055 | Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory | Katsunori Hirano, Yuji Sonoda, Wen Li, Tadanobu Toba, Takashi Kanesaka +1 more | 2006-11-14 |
| 7114110 | Semiconductor device, and the method of testing or making of the semiconductor device | Tadanobu Toba, Katsunori Hirano, Yuji Sonoda, Takeshi Wada | 2006-09-26 |
| 6826720 | Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory | Iwao Suzuki, Fumie Kobayashi, Hideyuki Aoki | 2004-11-30 |
| 5343047 | Ion implantation system | Hiroo Ono, Masayuki Tomoyasu, Naoki Takayama, Riki Tomoyoshi | 1994-08-30 |
| 5089710 | Ion implantation equipment | Mitsuyuki Yamaguchi, Masahiko Matsudo | 1992-02-18 |
| 5018145 | IC tester | Yoshio Ouchida, Ryohei Kamiya | 1991-05-21 |
| 4905183 | Pattern generator having plural pattern generating units executing instructions in parallel | Ikuo Kawaguchi, Chisato Hamabe | 1990-02-27 |
| 4785188 | Primary particle beam irradiation apparatus and method of irradiation thereof | Haruhisa Mori, Tadayuki Kojima, Satoshi Hasui, Hiroshi Ohmori | 1988-11-15 |
| 4783597 | Ion implant apparatus | Hisanori Misawa, Hidetaro Nishimura, Takaya Tsujimaru, Nobuyuki Abe, Kouichi Mori | 1988-11-08 |
| 4759021 | Test pattern generator | Ikuo Kawaguchi, Masaaki Inadachi | 1988-07-19 |