Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9026969 | Method of designing arrangement of TSV in stacked semiconductor device and designing system for arrangement of TSV in stacked semiconductor device | Myung-Soo Jang, Jae-Rim Lee, Jong-Wha Chong, Min Beom KIM, Cheol Jon JANG | 2015-05-05 |
| 8385627 | Method and apparatus for inspecting defects of semiconductor device | Tadanobu Toba, Shuji Kikuchi, Yuichi Sakurai | 2013-02-26 |
| 7137055 | Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory | Katsunori Hirano, Shuji Kikuchi, Yuji Sonoda, Tadanobu Toba, Takashi Kanesaka +1 more | 2006-11-14 |