| 9150962 |
Method for producing substrate with metal body |
Tatsuya Sakai, Hideki Nishimura, Masahiro Yamamoto, Hisashi Nakagawa, Ryuuichi Saitou +1 more |
2015-10-06 |
|
| 8496470 |
Injection molding die for producing a molded product having an appearance surface |
— |
2013-07-30 |
|
| 8298652 |
Injection molding die for producing molded product having appearance surface, injection molding method for producing molded product having appearance surface, and resin molded product molded by the injection molding method |
— |
2012-10-30 |
|
| 7356742 |
Method and apparatus for testing a memory device in quasi-operating conditions |
Takeshi Wada, Masaaki Namba, Noboru Uchida, Shigeki Katsumi, Yuji Wada +1 more |
2008-04-08 |
$183,000 |
| 7341133 |
Hydraulic circuit and hydraulic control unit for hydraulic power transmission |
Masahiko Ando, Hiroyuki Tsukamoto, Akira Fukatsu, Atsushi Mori, Akira Matsuo +1 more |
2008-03-11 |
|
| 7225372 |
Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory |
Iwao Suzuki, Shuji Kikuchi, Fumie Kobayashi |
2007-05-29 |
|
| 7200394 |
Information distribution service system based on predicted changes in location of mobile information terminal |
Norio Murakami |
2007-04-03 |
|
| 7024604 |
Process for manufacturing semiconductor device |
— |
2006-04-04 |
$107,000 |
| 7018857 |
Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe |
Masatoshi Kanamaru, Takanori Aono, Tatsuya Nagata, Kenji Kawakami |
2006-03-28 |
$141,000 |
| 6978295 |
Server apparatus for space information service, space information service providing method, and charge processing apparatus and charging method for space information service |
Yoshinobu Meifu, Keiji Mizuma |
2005-12-20 |
|
| 6955870 |
Method of manufacturing a semiconductor device |
Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu |
2005-10-18 |
$163,000 |
| 6952110 |
Testing apparatus for carrying out inspection of a semiconductor device |
Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu |
2005-10-04 |
$185,000 |
| 6885208 |
Semiconductor device and test device for same |
Toshio Miyatake, Tatsuya Nagata, Hiroya Shimizu, Ryuji Kohno |
2005-04-26 |
$100,000 |
| 6828810 |
Semiconductor device testing apparatus and method for manufacturing the same |
Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno, Hiroya Shimizu +1 more |
2004-12-07 |
|
| 6826720 |
Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory |
Iwao Suzuki, Shuji Kikuchi, Fumie Kobayashi |
2004-11-30 |
|
| 6774654 |
Semiconductor-device inspecting apparatus and a method for manufacturing the same |
Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more |
2004-08-10 |
|
| 6714030 |
Semiconductor inspection apparatus |
Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more |
2004-03-30 |
$280,000 |
| 6660541 |
Semiconductor device and a manufacturing method thereof |
Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno |
2003-12-09 |
$174,000 |
| 6573112 |
Semiconductor device manufacturing method |
Ryuji Kono, Akihiko Ariga, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more |
2003-06-03 |
$147,000 |
| 6566149 |
Method for manufacturing substrate for inspecting semiconductor device |
Masatoshi Kanamaru, Atsushi Hosogane, Yoshihige Endou, Ryuji Kouno, Hideo Miura +4 more |
2003-05-20 |
$125,000 |
| 6548315 |
Manufacture method for semiconductor inspection apparatus |
Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more |
2003-04-15 |
$98,000 |
| 6531327 |
Method for manufacturing semiconductor device utilizing semiconductor testing equipment |
Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Ryuji Kohno +1 more |
2003-03-11 |
$162,000 |
| 6507204 |
Semiconductor testing equipment with probe formed on a cantilever of a substrate |
Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Ryuji Kohno +1 more |
2003-01-14 |
$192,000 |
| 6496023 |
Semiconductor-device inspecting apparatus and a method for manufacturing the same |
Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more |
2002-12-17 |
$92,000 |
| 6479305 |
Semiconductor device manufacturing method |
Ryuji Kono, Akihiko Ariga, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more |
2002-11-12 |
$74,000 |
