Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7422914 | Fabrication method of semiconductor integrated circuit device | Yuji Wada, Akira Seito | 2008-09-09 |
| 7356742 | Method and apparatus for testing a memory device in quasi-operating conditions | Hideyuki Aoki, Takeshi Wada, Noboru Uchida, Shigeki Katsumi, Yuji Wada +1 more | 2008-04-08 |
| 7306957 | Fabrication method of semiconductor integrated circuit device | Yuji Wada, Akira Seito | 2007-12-11 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Toshio Miyatake +4 more | 2005-03-08 |
| 6696849 | Fabrication method of semiconductor integrated circuit device and its testing apparatus | Naoto Ban, Akio Hasebe, Yuji Wada, Ryuji Kohno, Akira Seito +1 more | 2004-02-24 |
| 6465264 | Method for producing semiconductor device and apparatus usable therein | Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Toshio Miyatake +4 more | 2002-10-15 |