Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7119362 | Method of manufacturing semiconductor apparatus | Ryuji Kono, Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo +5 more | 2006-10-10 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Toshio Miyatake, Hideo Miura +4 more | 2005-03-08 |
| 6714030 | Semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Hideyuki Aoki +1 more | 2004-03-30 |
| 6573112 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2003-06-03 |
| 6566149 | Method for manufacturing substrate for inspecting semiconductor device | Masatoshi Kanamaru, Yoshihige Endou, Ryuji Kouno, Hideo Miura, Shinji Tanaka +4 more | 2003-05-20 |
| 6548315 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Hideyuki Aoki +1 more | 2003-04-15 |
| 6531327 | Method for manufacturing semiconductor device utilizing semiconductor testing equipment | Masatoshi Kanamaru, Yoshishige Endo, Tatsuya Nagata, Ryuji Kohno, Hideyuki Aoki +1 more | 2003-03-11 |
| 6511857 | Process for manufacturing semiconductor device | Ryuji Kono, Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo +5 more | 2003-01-28 |
| 6507204 | Semiconductor testing equipment with probe formed on a cantilever of a substrate | Masatoshi Kanamaru, Yoshishige Endo, Tatsuya Nagata, Ryuji Kohno, Hideyuki Aoki +1 more | 2003-01-14 |
| 6479305 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2002-11-12 |
| 6465264 | Method for producing semiconductor device and apparatus usable therein | Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Toshio Miyatake, Hideo Miura +4 more | 2002-10-15 |
| 6358762 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Hideyuki Aoki +1 more | 2002-03-19 |
| 5276573 | Slider unit controllably actuated at a surface of a moving information recording medium | Takeshi Harada, Masatoshi Kanamaru, Akiomi Kohno, Kenji Mori | 1994-01-04 |