Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7541202 | Connection device and test system | Susumu Kasukabe, Terutaka Mori, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe | 2009-06-02 |
| 7285430 | Connection device and test system | Susumu Kasukabe, Terutaka Mori, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe | 2007-10-23 |
| 7214271 | Silicon single crystal wafer process apparatus, silicon single crystal wafer, and manufacturing method of silicon epitaxial wafer | Shoichi Takamizawa | 2007-05-08 |
| 7119362 | Method of manufacturing semiconductor apparatus | Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo, Takeshi Harada +5 more | 2006-10-10 |
| 6759258 | Connection device and test system | Susumu Kasukabe, Terutaka Mori, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe | 2004-07-06 |
| 6626994 | Silicon wafer for epitaxial wafer, epitaxial wafer, and method of manufacture thereof | Akihiro Kimura, Hideki Sato, Masahiro Kato, Masaro Tamatsuka | 2003-09-30 |
| 6573112 | Semiconductor device manufacturing method | Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more | 2003-06-03 |
| 6511857 | Process for manufacturing semiconductor device | Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo, Takeshi Harada +5 more | 2003-01-28 |
| 6479305 | Semiconductor device manufacturing method | Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more | 2002-11-12 |
| 6305230 | Connector and probing system | Susumu Kasukabe, Terutaka Mori, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe | 2001-10-23 |