Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7543203 | LSSD-compatible edge-triggered shift register latch | Gerry Ashton, Kevin A. Duncan, Terry D. Keim, Tad J. Wilder | 2009-06-02 |
| 7237165 | Method for testing embedded DRAM arrays | Laura S. Chadwick, William R. J. Corbin, Jeffrey H. Dreibelbis, Erik A. Nelson, Thomas E. Obremski +1 more | 2007-06-26 |
| 7222274 | Testing and repair methodology for memories having redundancy | Michael Combs, Dale B. Grosch, Guy M. Vanzo | 2007-05-22 |
| 7073100 | Method for testing embedded DRAM arrays | Laura S. Chadwick, William R. J. Corbin, Jeffrey H. Dreibelbis, Erik A. Nelson, Thomas E. Obremski +1 more | 2006-07-04 |
| 6819160 | Self-timed and self-tested fuse blow | — | 2004-11-16 |
| 6397361 | Reduced-pin integrated circuit I/O test | — | 2002-05-28 |
| 6304122 | Low power LSSD flip flops and a flushable single clock splitter for flip flops | Roger P. Gregor, Steven F. Oakland, Sebastian T. Ventrone | 2001-10-16 |
| 5826006 | Method and apparatus for testing the data output system of a memory system | — | 1998-10-20 |
| 5689514 | Method and apparatus for testing the address system of a memory system | — | 1997-11-18 |
| 5679897 | Piezoelectric type acceleration sensor with metallic case and resin package | Hideki Matsumoto, Harumi Aoki, Shinji Shimazaki, Katsuyuki Tsuji | 1997-10-21 |